
Monday March 5, 2018
7:00 a
Continental Breakfast
8:30 a
9:00 a
What failure rate is good enough? How reliable do today’s and tomorrow’s semiconductor devices and sensors need to be? How critical are failure rates and how are they evolving with increased customer demands for security, safety, and reliability? What is the impact of consumer confidence on industries such as automotive, personal health, and even mobile devices?
This keynote address dives into these questions and highlights challenges in our industry’s historical infrastructure and test methodologies. It provides the context for what we should all be asking ourselves: Are we really providing enough test coverage and assurance of reliability for new applications with higher quality and reliability requirements than ever seen before? Is this coverage sufficient to enable these applications to safely become pervasive over the next decade?
10:00 a
Break & Networking
10:30 a
10:30 a
12:30 p
Lunch
1:30 p
1:30 p
3:30 p
4:30 p
4:30 p

