TestConX 2023 – Monday

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Monday March 6, 2023

7:00 a

Continental Breakfast

Start the day right and enjoy the continental breakfast while networking with other attendees.

8:30 a

Welcome
Red Mountain Ballroom
Opening Remarks

Welcoming remarks from the General Chair, Ira Feldman

9:00 a

Session 1
Red Mountain Ballroom
Battery & Power Applications
“Li-ion cell formation and test overview”
Shuary Anand
Texas Instruments
Taras Dudar
Texas Instruments
“Design considerations for ultra-high current Power Delivery Networks (PDN)”
Quaid Joher Furniturewala
Advantest

10:00 a

Break & Networking

Enjoy the break and networking time.

10:30 a

Session 2
Red Mountain Ballroom
High Speed & High Frequency
“Into the PCB at 90 - high GHz signal launches”
Gert Hohenwarter
GateWave Northern, Inc.
“Transmission Line of RF, SERDES I/O Test Hardware Signal Path”
Noel Del Rio
NXP Semiconductor
“Verification of interconnect solution options for 28G Si Validation”
Paul Schubring
HighRel
Noel Del Rio
NXP Semiconductor
Dan Hwang
HiCon Global
“Utilizing System Level Test to Achieve High-throughput, Automated RF Testing”
John Toscano
Teradyne

12:30 p

Lunch

Lunch is served. Enjoy the break and networking time.

1:30 p

Keynote
Red Mountain Ballroom
Keynote
“Mixed Reality: The Metaverse and what it means to Test Engineering.”
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In recent times, we’ve been through the Personal Computer, the Internet, the Cell phone, and most recently the Smart Phone revolution. The next disruption is mixed reality (Augmented Reality & Virtual Reality) and the Metaverse. We are at the emerging phase of the Metaverse.


There will be new challenges in developing and building the technology (semiconductors, optics, materials, and software) that will enable us to interact with the Metaverse in ubiquitous and natural ways. Arguably the massive computing and other product requirements will drive semiconductor technology far beyond today’s devices which will in turn significantly change how devices are designed, built, and tested. We will discuss what it will mean for Test Engineering!


2:30 p

Session 3
Red Mountain Ballroom
Test Application Trends
“Battery Management Systems Device Testing and Trends for Automotive”
Brent Rousseau
Teradyne
“New trends in semiconductor factory automation”
Lutz Naumann
Texas Instruments
Taras Dudar
Texas Instruments
Ramana Tadepalli
Texas Instruments

3:30 p

Break & Networking

Enjoy the break and networking time.

4:00 p

Session 4
Red Mountain Ballroom
Contact Technology
“The Past and Future of the RF Wafer Probes”
Don Thompson
PTSL
“The Evolution of the Coaxial Contactor and the Advantage of the Modern Version”
Jason Mroczkowski
Cohu
“Multi-disciplinary approach for the development of a MEMS Spring Probe for high frequency application”
Nadia Paderno
Technoprobe
Francesco Signorello
Technoprobe
Jacopo Martelli
Technoprobe

6:00 p

TestConX EXPO & Reception

The TestConX EXPO is a very popular part of the TestConX program with many great exhibits for connecting electronic test professionals to solutions. There is always something new to see or someone new to meet. Not to mention excellent food, drinks, and time for attendees to network with exhibitors!

9:00 p

Adjourn

Program subject to change without notice.