BiTS 2016 Session 4

"High Speed BGA Sockets from a System Perspective"

Don Thompson
R&D Altanova

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"A Solution of Test, Inspection and Evaluation for Blind Signal Waveform on a Board"

Tatsumi Watabe
Makoto Kawamura
Hiroyuki Yamakoshi
S.E.R. Corporation

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"Device Packaging and How It Affects RF Performance"

Noureen Sajid, Jeff Sherry
Johnstech International

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"Automotive Radar Test"

Jason Mroczkowski
Xcerra Corporation

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