"Long Life Probe Pin by Electroforming Process"
Makota Kondo & Hirotada Teranishi
Takahiro Sakai & Naoyuki Kimura
Omron Corporation
"Carbon Nanotube Polymer Composites as High Performance Thermal Interface Materials for Burn in and Test Applications"
Leonardo Prinzi
Georgia Institute of Technology
Craig Green & Baratunde Cola
Carbice Nanotechnologies, Inc.
"Requirements and Solutions for Test PCBs"
Markku Jamsa
Aspocomp Group Oyj
"PCB Test Fixture and Socket Challenges for mmWave Applications"
Don Thompson Jose
R&D Altanova
Jose Moreira
Advantest Europe GmbH
Giovanni Bianchi
Advantest
Return to the 2016 BiTS Workshop Archive index page