"Process Improvements to Increase Burn-In Yield and Quality"
Jeanette Linn
Texas Instruments
Rich Karr
Texas Instruments
"Device Characterization Over Temperature at the Board Level"
Barry Johnson
inTEST Thermal Solutions
"Qualifying A Process For Higher Burn-In Voltage Application"
Krishna Mohan Chavali
Globalfoundries US Inc
"Coming Challenges and Opportunities for MEMS Testing Supply Chain"
Wendy Chen
KYEC
Return to the 2017 BiTS Workshop Archive index page