Contacts, test probes, and sockets have to accommodate ever-finer pitches, while holding up repeatedly to increasingly stressful conditions. This session looks at the impact of choosing the right materials and fabrication processes to address these situations and to increase the life of test consumables. Mike Gideon, Materion, discusses reliability and failure over time along with how to prevent failure by understanding root causes. Jimmy Johnson, Tyco Electronics, investigates using cold heading technology, selective gold plating, and a proprietary plating process to produce lower cost, high-reliability burn-in and test sockets. Jeb Flemming, 3D Glass Solutions, explores glass as an alternative to injected molded plastic for cost-effective test and burn-in sockets for radio-frequency (RF) device test. Bert Brost, Xcerra, talks about a novel coating technology that prevents solder migration at the contactor tips, thereby improving contact stability.
"Reliability and Failure over Time"
Mike Gedeon
Materion
"Using Cold Heading Technology and Deutsch Coat to Produce Test Probes & Spring Contacts "
Jimmy L. Johnson
Tyco Electronics
"APEX Glass for Burn-In and Test Sockets"
Jeb H. Flemming, Tim Foster
3D Glass Solutions, Inc.
"C3 Coating : Solution for IC Testing"
Bert Brost, Valts Treibergs
Xcerra Corporation
Nakaya Katsura
Kobelco Research Institute, Inc.
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