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Session 1 – A Clean Start
There's no doubt about it, clean contacts in contactors and sockets work a lot better than dirty ones. So what better place to start looking at burn-in and test strategies than with a close look at contamination control and cleaning processes to improve yields, test time and re-test reduction? This session begins with three hypotheses of the causes for contact contamination, Along with guidance on procedural changes for improved performance. The next presentation offers a solution to the havoc high temperature burn-in can wreak on devices under test (DUTs) with a specialized coating process to prevent solder contamination of contacts and deformation of the solder bumps on the DUT. The final two presentations examine online cleaning processes. The first focuses on a characterization tool that determines the effectiveness of online cleaning, while the second is directed at an automatic cleaning solution for a bowl fed handler used with a RF contactor. Hey, it's a dirty job, but somebody's got to do it."Contamination Mechanisms of Contact Probes"
Jon Diller, Kevin DeFord
Smith Connectors | IDI
"Special Coating Cleans-Up a Mess"
Paul Ruo
Aries Electronics, Inc
Erik Orwoll
Contact Coatings, LLC
"Unique Methodologies for Investigating On-line Cleaning Process Parameters and Recipe Optimization"
Jerry Broz, Soheil Khavandi, Bret Humphrey
International Test Solutions, Inc.
"Yield and Test Time Improvement via Automated Online Cleaning"
Brent Edington
TriQuint
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