BiTS 2016 Session 6

"Vision Assist Method for Common Change Kit"

Brad Emberger
Zain Abadin
Advantest

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"Test Cell Thermal Solution"

Gianluca Lombardi
Advantest

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"Testing Magnetic Sensors"

Paul Ruo
Aries Electronics, Inc.
Larre Nelson
Kita USA

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"Magnetically shielded test-cell for an integrated fluxgate sensor"

Gert Haensel
Texas Instruments
Loren Hillukka
Johnstech International Ltd.

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