"PCB Test Fixture and DUT Socket Challenges for 32 Gbps/GBaud ATE Applications"
"超高速信号(32Gbps/Gbaud)的测试: 电路板与测试基座的设计与挑战"
Jose Moreira
Advantest
Christian Borelli
STMicroelectronics
Fulvio Corneo
STMicroelectronics
"Designing Sockets for Ludicrous Speed (80 GHz)"
"适用于飞速(80 GHz)测试的 Socket 设计"
Don Thompson
R&D Altanova
Jose Moreira
Advantest
"Comparison of Different Methods in Determining Current Carrying Capacity of Semiconductor Test Contacts"
"半导体测试触头电流承载能力测定方法的比较"
Valts Treibergs
Xcerra Corporation
Mitchell Nelson
Xcerra Corporation
"The Economics of Semiconductor Test – Challenges and Opportunities for 2016"
"半导体测试的经济学-2016年的挑战和机遇"
John West
VLSI Research Europe
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