Quad-Site Production Wafer Probing of 77-81 GHz Automotive Radar Devices

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Session 4
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Test Cell Integration & Automated Test Equipment
“Quad-Site Production Wafer Probing of 77-81 GHz Automotive Radar Devices”
Marty Cavegn
Cohu
Jason Mroczkowski
Cohu
Jory Twitchell
NXP Semiconductors
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