Quad-Site Production Wafer Probing of 77-81 GHz Automotive Radar Devices

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Session 4

Total Solutions

Test Cell Integration & Automated Test Equipment

“Quad-Site Production Wafer Probing of 77-81 GHz Automotive Radar Devices”

Martinrty "Marty" Cavegn

Cohu

Jason Mroczkowski

Cohu

Jory "Jory" Twitchell

NXP Semiconductors

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