Session 5 – Better By Design


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The greatest results always begin with a good design. In the world of test and burn-in, the variations are endless. That’s why this session features a broad assortment of design topics and perspectives. Beyond socket design, we’ll learn about designing the right handler for the job. Next is a birds-eye view of a socket’s creation from design concept to final assembly, followed by a specific look at designs and applications for package-on-package (PoP) device testing.

"A Novel Nested Doll Concept in Universal Kit for Test Handler"
Yee Wei Tiang
Intel ATM Penang, Malaysia

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"Anatomy of a Socket"
Paul F. Ruo
Aries Electronics, Inc.

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"Special Designs and Applications for PoP Device Testing"
Siang Soh, Frank Zhou, James Spooner, Khaled Elmadbouly, Jon Diller
Interconnect Devices, Inc.

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