BiTS China 2017

Tutorial - September 6, 2017

• Tutorial – Interconnect Sockets and Applications

Session 1 - September 7, 2017

• Opening Remarks
• Keynote - Fan Out Technology Overview
• Market Place Report - Opportunities and Challenges of the Chinese Test and Burn-in Sockets Market
• High Speed Testing
• Flat Probe Technology for RF Test
• Coplanar Waveguide On Wafer Calibration Technology for Enabling High Volume Microwave On-Wafer Test
• DUT ATE Test Fixture S-Parameters Estimation using 1x-Reflect Methodology
• Contactor Arcing Fundamentals

Session 2

• The challenge of testing and burn-in for System in Package
• Socket Material Characterization & Selection
• Deterministic contact resistance of BGA contact pins
• New universal multi-beam Kelvin contactor concept for turret applications