Welcome!
To access the archive contents (presentation slides, videos, multimedia, etc.) sign in using your LinkedIn account by clicking the LinkedIn button to the right. Full Conference Attendees and Subscribers have access to all content now. FREE guests, once signed in, have access to the presentations after July 1, 2015.
------ This message is only displayed when you are not signed in. ------
Session 1 - Wednesday, October 21, 2015
- Opening Remarks
- Keynote - China’s Impact on the Semiconductor Industry
- PCB Test Fixture and DUT Socket Challenges for 32 Gbps/Gbaud ATE Applications
- Designing Sockets for Ludicrous Speed(80 GHz)
- Comparison of Different Methods in Determining Current Carrying Capacity of Semiconductor Test Contacts
- The Economics of Semiconductor Test Challenges and Opportunities for 2016