
{"id":852,"date":"2014-03-12T09:18:56","date_gmt":"2014-03-12T16:18:56","guid":{"rendered":"https:\/\/www.testconx.org\/premium\/?p=852"},"modified":"2023-05-15T09:59:39","modified_gmt":"2023-05-15T16:59:39","slug":"session-7-feel-the-burn-in","status":"publish","type":"post","link":"https:\/\/www.testconx.org\/premium\/2014\/session-7-feel-the-burn-in\/","title":{"rendered":"Session 7 &#8211; Feel the Burn-In"},"content":{"rendered":"\n<h1><span style=\"color: #339966;\">Welcome!<\/span><\/h1>\n<h2>To access the archive contents (presentation slides, videos, multimedia, etc.) sign in using your LinkedIn account by clicking the LinkedIn button to the right. Full Conference Attendees and <a title=\"Access \u2013 Subscribe\" href=\"\/premium\/welcome\/\" title=\"Details about subscriptions\">Subscribers<\/a> have access to all content now. FREE guests, once signed in, have access to the presentations after June 1, 2014.<\/h2>\n<p><span style=\"color: #339966;\">------ This message is only displayed when you are not signed in. ------<\/span><\/p>\n<h1 class=\"entry-title\" style=\"font-weight:normal;\">Session 7 &#8211; Feel the Burn-In<\/h1>\n\nBurn-in is used to ensure a device's reliability and lifetime. The two papers in this final session look at parallel burn-in methods. The first presents an overview of built-in IC test and monitoring methods and describes the access buses for these test and monitor methodologies. It will also describe a hardware and software framework that exploits these test technologies for the massively parallel burn-in and test of 100's of complex ICs. The second presents some interesting challenges along the road to parallel burn-in test. It will include design requirements and rules to optimize the overall device power consumption; and go one step further on managing the unexpected challenges.<br \/>\n<!--more--><br \/>\n<strong>\"Massively Parallel Burn-in Test using IC Serial Buses\"<\/strong><br \/>\nBilly Fenton<br \/>\nOLAS Consulting<\/p>\n<p>Pat Mitchell<br \/>\nAccutron<\/p>\n<p><a href=\"\/premium\/welcome\/\"><img loading=\"lazy\" decoding=\"async\" class=\"alignleft size-full wp-image-129\" title=\"Click here to subscribe to PREMIUM content\" alt=\"\" src=\"\/premium\/wp-content\/uploads\/premium-video-non-subscriber.png\" width=\"480\" height=\"270\" srcset=\"https:\/\/www.testconx.org\/premium\/wp-content\/uploads\/premium-video-non-subscriber.png 480w, https:\/\/www.testconx.org\/premium\/wp-content\/uploads\/premium-video-non-subscriber-300x168.png 300w\" sizes=\"auto, (max-width: 480px) 100vw, 480px\" \/><\/a><\/p>\n<div style=\"clear: both;\"><\/div>\n<p><a href=\"\/premium\/wp-content\/uploads\/2014\/BiTS2014s7p1Fenton_7631.pdf\" target=\"_blank\"><img loading=\"lazy\" decoding=\"async\" class=\"size-full wp-image-70\" alt=\"PDF-Icon 150x139\" src=\"\/premium\/wp-content\/uploads\/PDF-Icon-150x139.png\" width=\"75\" height=\"70\" \/><\/a>&nbsp;<a href=\"\/premium\/wp-content\/uploads\/2014\/BiTS2014s7p1Fenton_7631.pdf\" target=\"_blank\" \/>Presentation Download<\/a>\t<\/p>\n<p><strong>\"Challenges of Increasing Parallelism in Burn-in Testing\"<\/strong><br \/>\nYeow Hock Low<br \/>\nInfineon Technologies Asia Pacific<\/p>\n<p><a href=\"\/premium\/welcome\/\"><img loading=\"lazy\" decoding=\"async\" class=\"alignleft size-full wp-image-129\" title=\"Click here to subscribe to PREMIUM content\" alt=\"\" src=\"\/premium\/wp-content\/uploads\/premium-video-non-subscriber.png\" width=\"480\" height=\"270\" srcset=\"https:\/\/www.testconx.org\/premium\/wp-content\/uploads\/premium-video-non-subscriber.png 480w, https:\/\/www.testconx.org\/premium\/wp-content\/uploads\/premium-video-non-subscriber-300x168.png 300w\" sizes=\"auto, (max-width: 480px) 100vw, 480px\" \/><\/a><\/p>\n<div style=\"clear: both;\"><\/div>\n<p><a href=\"\/premium\/wp-content\/uploads\/2014\/BiTS2014s7p2Low_7386.pdf\" target=\"_blank\"><img loading=\"lazy\" decoding=\"async\" class=\"size-full wp-image-70\" alt=\"PDF-Icon 150x139\" src=\"\/premium\/wp-content\/uploads\/PDF-Icon-150x139.png\" width=\"75\" height=\"70\" \/><\/a>&nbsp;<a href=\"\/premium\/wp-content\/uploads\/2014\/BiTS2014s7p2Low_7386.pdf\" target=\"_blank\" \/>Presentation Download<\/a>\t<\/p>\n<p>&nbsp;<\/br><br \/>\nReturn to the 2014 BiTS Workshop Archive <a title=\"Return to 2014 Index\" href=\"\/premium\/bits-workshop-2014-event-archive\">index page<\/a><\/p>\n","protected":false},"excerpt":{"rendered":"<p>Burn-in is used to ensure a device&#8217;s reliability and lifetime. The two papers in this final session look at parallel burn-in methods. The first presents an overview of built-in IC test and monitoring methods and describes the access buses for these test and monitor methodologies. It will also describe a hardware and software framework that exploits these test technologies for &#8230; <\/p>\n<div><a href=\"https:\/\/www.testconx.org\/premium\/2014\/session-7-feel-the-burn-in\/\" class=\"more-link\">Read More<\/a><\/div>\n","protected":false},"author":1,"featured_media":0,"comment_status":"closed","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"footnotes":""},"categories":[8],"tags":[],"class_list":["post-852","post","type-post","status-publish","format-standard","hentry","category-bits2014","no-post-thumbnail"],"_links":{"self":[{"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/posts\/852","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/users\/1"}],"replies":[{"embeddable":true,"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/comments?post=852"}],"version-history":[{"count":6,"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/posts\/852\/revisions"}],"predecessor-version":[{"id":2723,"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/posts\/852\/revisions\/2723"}],"wp:attachment":[{"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/media?parent=852"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/categories?post=852"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/tags?post=852"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}