{"id":843,"date":"2014-03-10T13:30:05","date_gmt":"2014-03-10T20:30:05","guid":{"rendered":"https:\/\/www.testconx.org\/premium\/?p=843"},"modified":"2023-05-15T09:59:51","modified_gmt":"2023-05-15T16:59:51","slug":"techtalk-the-most-common-mistakes-in-test","status":"publish","type":"post","link":"https:\/\/www.testconx.org\/premium\/2014\/techtalk-the-most-common-mistakes-in-test\/","title":{"rendered":"TechTalk – The Most Common Mistakes in Test"},"content":{"rendered":"\n

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TechTalk – The Most Common Mistakes in Test<\/h1>\n\nDuring the process of test program development, characterization, and limit setting, there are some common mistakes that can be made by Product and Test engineers. Issues like \u2018data that is too good to be true\u2019, not understanding the limitations of using a Standard Deviation, passing devices with \u201c0\u201d values, and limits that allow for the \u2018physically impossible\u2019 such as negative supply currents. Examples of real products and real issues (including those with test tooling), with how limits were set, or how data was interpreted, are used to highlight some of the most common (and 100% avoidable) mistakes.
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\n\"The Most Common Mistakes in Test\"<\/strong>
\nJeffrey L. Roehr
\nTest and Data Analyst
\nTexas Instruments<\/p>\n

Jeffrey Roehr has over 30 years of experience in Product and Test Engineering and Management for RCA, GTE, Analog Devices, Mediatek, and is now working for Texas Instruments (MCU\/C2000) in Houston.<\/p>\n

For the past 10 years his focus has been on developing algorithms for adaptive testing, outlier elimination, and statistical testing on very high volume production products.<\/p>\n

Mr. Roehr has presented many papers, tutorials, and invited talks at IEEE events. He is a Senior Member of the IEEE, the Technical Program Chair of the IEEE DATA workshop, a member of the ITRS Adaptive Test working group, and is the founder and chairman of the Texas Instruments Data Analysis Workshop (DAW).<\/p>\n

Part One<\/strong>
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