{"id":811,"date":"2014-03-11T09:57:54","date_gmt":"2014-03-11T16:57:54","guid":{"rendered":"https:\/\/www.testconx.org\/premium\/?p=811"},"modified":"2023-05-15T09:59:51","modified_gmt":"2023-05-15T16:59:51","slug":"session-1-a-clean-start","status":"publish","type":"post","link":"https:\/\/www.testconx.org\/premium\/2014\/session-1-a-clean-start\/","title":{"rendered":"Session 1 – A Clean Start"},"content":{"rendered":"\n

Welcome!<\/span><\/h1>\n

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Session 1 – A Clean Start<\/h1>\n\nThere's no doubt about it, clean contacts in contactors and sockets work a lot better than dirty ones. So what better place to start looking at burn-in and test strategies than with a close look at contamination control and cleaning processes to improve yields, test time and re-test reduction? This session begins with three hypotheses of the causes for contact contamination, Along with guidance on procedural changes for improved performance. The next presentation offers a solution to the havoc high temperature burn-in can wreak on devices under test (DUTs) with a specialized coating process to prevent solder contamination of contacts and deformation of the solder bumps on the DUT. The final two presentations examine online cleaning processes. The first focuses on a characterization tool that determines the effectiveness of online cleaning, while the second is directed at an automatic cleaning solution for a bowl fed handler used with a RF contactor. Hey, it's a dirty job, but somebody's got to do it.
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\n\"Contamination Mechanisms of Contact Probes\"<\/strong>
\nJon Diller, Kevin DeFord
\nSmith Connectors | IDI<\/p>\n

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\"PDF-Icon<\/a> Presentation Download<\/a>\t\t\t\t\t\t<\/p>\n

\"Special Coating Cleans-Up a Mess\"<\/strong>
\nPaul Ruo
\nAries Electronics, Inc<\/p>\n

Erik Orwoll
\nContact Coatings, LLC<\/p>\n

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\"PDF-Icon<\/a> Presentation Download<\/a>\t\t\t\t\t\t<\/p>\n

\"Unique Methodologies for Investigating On-line Cleaning Process Parameters and Recipe Optimization\"<\/strong>
\nJerry Broz, Soheil Khavandi, Bret Humphrey
\nInternational Test Solutions, Inc.<\/p>\n

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\"PDF-Icon<\/a> Presentation Download<\/a>\t\t\t\t\t\t<\/p>\n

\"Yield and Test Time Improvement via Automated Online Cleaning\"<\/strong>
\nBrent Edington
\nTriQuint
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\"PDF-Icon<\/a> Presentation Download<\/a>\t\t\t\t\t<\/p>\n

 <\/br>
\nReturn to the 2014 BiTS Workshop Archive index page<\/a><\/p>\n","protected":false},"excerpt":{"rendered":"

There’s no doubt about it, clean contacts in contactors and sockets work a lot better than dirty ones. So what better place to start looking at burn-in and test strategies than with a close look at contamination control and cleaning processes to improve yields, test time and re-test reduction? This session begins with three hypotheses of the causes for contact … <\/p>\n

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