{"id":506,"date":"2013-03-06T14:22:41","date_gmt":"2013-03-06T22:22:41","guid":{"rendered":"https:\/\/www.testconx.org\/premium\/?p=506"},"modified":"2023-05-15T09:59:51","modified_gmt":"2023-05-15T16:59:51","slug":"awards-closing-remarks","status":"publish","type":"post","link":"https:\/\/www.testconx.org\/premium\/2013\/awards-closing-remarks\/","title":{"rendered":"Awards & Closing Remarks"},"content":{"rendered":"\n

Welcome!<\/span><\/h1>\n

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Awards & Closing Remarks<\/h1>\n\nIt's been three days packed with learning, exploring and sharing, but now it's time to pack our bags and take what we've learned back to our jobs. But first, there are a few closing remarks and some recognition to the people and papers that have distinguished themselves in one way or another at BiTS 2013.
\n<\/p>\n

Closing Remarks<\/strong>
\nFred Taber
\nGeneral Chairman, BiTS Workshop<\/p>\n

<\/div>\n

\"PDF-Icon<\/a> Poster Download<\/a><\/p>\n

Awards<\/h2>\n

\u201cAuto Centering Manual Actuator
\nOne Manual Lid for Different Package Sizes Testing\u201d<\/strong>
\nYing Hoe Mah, Shamal Mundiyath
\nJF Microtechnology Berhad
\n\"Best\t <\/p>\n

<\/div>\n

\"PDF-Icon<\/a> Poster Download<\/a><\/p>\n

\"High Temperature Burn-in (Up to 200 Deg. C): Are We Ready Yet?\"<\/strong>
\nNoriyuki Matsuoka, Kazumi Uratsuji
\nYamaichi Electronics Co., Ltd.<\/p>\n

Jec Sangalang
\nYamaichi Electronics USA<\/p>\n

Ryota Takeuchi
\nNGK Insulators, Ltd.
\n\"\"<\/p>\n

\"\"<\/a><\/p>\n

<\/div>\n

\"PDF-Icon<\/a> Presentation Download<\/a>\t\t\t\t\t\t\t\t\t\t<\/p>\n

\"Bridging Between 3D and 3D TSV Stacking Technologies\"<\/strong>
\nBelgacem Haba, Ph.D.
\nInvensas
\n\"\"<\/p>\n

\"\"<\/a><\/p>\n

<\/div>\n

\"PDF-Icon<\/a> Presentation Download<\/a>\t<\/p>\n

\"Anatomy of a Socket\"<\/strong>
\nPaul F. Ruo
\nAries Electronics, Inc.
\n\"\"<\/p>\n

\"\"<\/a><\/p>\n

<\/div>\n

\"PDF-Icon<\/a> Presentation Download<\/a>\t<\/p>\n

\"Optimization of Package, Socket, and PC board for 25 to 40GHz RF Devices\"<\/strong>
\nCarol McCuen, Phil Warwick
\nR & D Circuits
\n\"\"<\/p>\n

\"\"<\/a><\/p>\n

<\/div>\n

\"PDF-Icon<\/a> Presentation Download<\/a>\t\t\t\t\t\t\t\t<\/p>\n

\"Die-Cracking Failure Analysis of QFN Packages in Manual Test Handler\"<\/strong>
\nM.P. Divakar, PhD
\nStack Design Automation
\n\"\"<\/p>\n

\"\"<\/a><\/p>\n

<\/div>\n

\"PDF-Icon<\/a> Presentation Download<\/a>\t<\/p>\n

 <\/br>
\nReturn to the 2013 BiTS Workshop Archive index page<\/a><\/p>\n","protected":false},"excerpt":{"rendered":"

It’s been three days packed with learning, exploring and sharing, but now it’s time to pack our bags and take what we’ve learned back to our jobs. But first, there are a few closing remarks and some recognition to the people and papers that have distinguished themselves in one way or another at BiTS 2013.<\/p>\n","protected":false},"author":1,"featured_media":0,"comment_status":"closed","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"footnotes":""},"categories":[3],"tags":[],"class_list":["post-506","post","type-post","status-publish","format-standard","hentry","category-bits2013","no-post-thumbnail"],"_links":{"self":[{"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/posts\/506","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/users\/1"}],"replies":[{"embeddable":true,"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/comments?post=506"}],"version-history":[{"count":22,"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/posts\/506\/revisions"}],"predecessor-version":[{"id":2628,"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/posts\/506\/revisions\/2628"}],"wp:attachment":[{"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/media?parent=506"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/categories?post=506"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/tags?post=506"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}