{"id":45,"date":"2013-03-05T15:20:32","date_gmt":"2013-03-05T23:20:32","guid":{"rendered":"http:\/\/www.bitsworkshop.org\/wordpress\/?p=45"},"modified":"2023-05-15T09:59:51","modified_gmt":"2023-05-15T16:59:51","slug":"session-5-better-by-design","status":"publish","type":"post","link":"https:\/\/www.testconx.org\/premium\/2013\/session-5-better-by-design\/","title":{"rendered":"Session 5 – Better By Design"},"content":{"rendered":"\n

Welcome!<\/span><\/h1>\n

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<\/h1>\n\nThe greatest results always begin with a good design. In the world of test and burn-in, the variations are endless. That\u2019s why this session features a broad assortment of design topics and perspectives. Beyond socket design, we\u2019ll learn about designing the right handler for the job. Next is a birds-eye view of a socket\u2019s creation from design concept to final assembly, followed by a specific look at designs and applications for package-on-package (PoP) device testing.
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\n\"A Novel Nested Doll Concept in Universal Kit for Test Handler\"<\/strong>
\nYee Wei Tiang
\nIntel ATM Penang, Malaysia<\/p>\n

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\"PDF-Icon<\/a> Presentation Download<\/a>
\n\"Anatomy of a Socket\"<\/strong>
\nPaul F. Ruo
\nAries Electronics, Inc.
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\"PDF-Icon<\/a> Presentation Download<\/a>
\n\"Special Designs and Applications for PoP Device Testing\"<\/strong>
\nSiang Soh, Frank Zhou, James Spooner, Khaled Elmadbouly, Jon Diller
\nInterconnect Devices, Inc.<\/p>\n

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\"PDF-Icon<\/a> Presentation Download<\/a>
\n 
\nReturn to the 2013 BiTS Workshop Archive index page<\/a><\/p>\n","protected":false},"excerpt":{"rendered":"

The greatest results always begin with a good design. In the world of test and burn-in, the variations are endless. That\u2019s why this session features a broad assortment of design topics and perspectives. Beyond socket design, we\u2019ll learn about designing the right handler for the job. Next is a birds-eye view of a socket\u2019s creation from design concept to final … <\/p>\n

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