
{"id":4321,"date":"2020-04-07T21:59:48","date_gmt":"2020-04-08T04:59:48","guid":{"rendered":"https:\/\/www.testconx.org\/premium\/?p=4321"},"modified":"2023-05-15T09:58:32","modified_gmt":"2023-05-15T16:58:32","slug":"quad-site-production-wafer-probing-of-77-81-ghz-automotive-radar-devices","status":"publish","type":"post","link":"https:\/\/www.testconx.org\/premium\/2020\/quad-site-production-wafer-probing-of-77-81-ghz-automotive-radar-devices\/","title":{"rendered":"Quad-Site Production Wafer Probing of 77-81 GHz Automotive Radar Devices"},"content":{"rendered":"<div id=\"cs-content\" class=\"cs-content\"><\/div>\n","protected":false},"excerpt":{"rendered":"<p>Virtual Event Index Session 4Total SolutionsTest Cell Integration &amp; Automated Test Equipment &ldquo;Quad-Site Production Wafer Probing of 77-81 GHz Automotive Radar Devices&rdquo; Martinrty &#8220;Marty&#8221; Cavegn Cohu Jason Mroczkowski Cohu Jory &#8220;Jory&#8221; Twitchell NXP Semiconductors &nbsp;Presentation Download Virtual Event Index Session 4Total SolutionsTest Cell Integration &amp; Automated Test Equipment &ldquo;Quad-Site Production Wafer Probing of 77-81 GHz Automotive Radar Devices&rdquo; Marty Cavegn &#8230; <\/p>\n<div><a href=\"https:\/\/www.testconx.org\/premium\/2020\/quad-site-production-wafer-probing-of-77-81-ghz-automotive-radar-devices\/\" class=\"more-link\">Read More<\/a><\/div>\n","protected":false},"author":548,"featured_media":0,"comment_status":"closed","ping_status":"closed","sticky":false,"template":"","format":"standard","meta":{"footnotes":""},"categories":[29,25],"tags":[],"class_list":["post-4321","post","type-post","status-publish","format-standard","hentry","category-2020-4","category-testconx2020","no-post-thumbnail"],"_links":{"self":[{"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/posts\/4321","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/users\/548"}],"replies":[{"embeddable":true,"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/comments?post=4321"}],"version-history":[{"count":7,"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/posts\/4321\/revisions"}],"predecessor-version":[{"id":4678,"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/posts\/4321\/revisions\/4678"}],"wp:attachment":[{"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/media?parent=4321"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/categories?post=4321"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/tags?post=4321"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}