{"id":3153,"date":"2018-10-23T23:59:23","date_gmt":"2018-10-24T06:59:23","guid":{"rendered":"https:\/\/www.testconx.org\/premium\/?p=3153"},"modified":"2023-05-15T09:58:50","modified_gmt":"2023-05-15T16:58:50","slug":"testconx-china-2018-session-4","status":"publish","type":"post","link":"https:\/\/www.testconx.org\/premium\/2018\/testconx-china-2018-session-4\/","title":{"rendered":"TestConX China 2018 Session 4"},"content":{"rendered":"<div class=\"presentation\" id=\"s4p1\">\"The Impact on Probe Pin Performance of Different Plunger Cutting Methods at Device Side\"\n<\/div>\n<p>\n<strong>\"\u51a0\u88c5\u63a2\u9488\u7684\u7c97\u7cd9\u9762\u5bf9\u63a2\u9488\u6027\u80fd\u7684\u5f71\u54cd\"<\/strong><\/p>\n<p>Roger McAleenan<br \/>\nAdvantest<br \/>\nAlfred Lim<br \/>\nTest Tooling Solutions Group<br \/>\nTakuto Yoshida<br \/>\nTest Tooling Solutions Group<\/p>\n<p><strong>\"Suzhou\"<\/strong><br \/>\n<script src=\"https:\/\/cdn.jwplayer.com\/libraries\/eO3bkuSw.js?exp=1776409018&sig=4f4a435dba07d7a9037164ec452cb9d6\"> <\/script><\/p>\n<div id=\"bits-video-69e1d7626621b\" class=\"s2member-jwplayer-v7\">Video Player Goes Here<\/div>\n<h4>Sorry, you do not NOT have access to this file.<\/h4>\n<p><strong>\"Shenzhen\"<\/strong><br \/>\n<a href=\"\/premium\/welcome\/\"><img loading=\"lazy\" decoding=\"async\" class=\"alignleft size-full wp-image-129\" title=\"Click here to subscribe to PREMIUM content\" alt=\"\" src=\"\/premium\/wp-content\/uploads\/premium-video-non-subscriber.png\" width=\"480\" height=\"270\" srcset=\"https:\/\/www.testconx.org\/premium\/wp-content\/uploads\/premium-video-non-subscriber.png 480w, https:\/\/www.testconx.org\/premium\/wp-content\/uploads\/premium-video-non-subscriber-300x168.png 300w\" sizes=\"auto, (max-width: 480px) 100vw, 480px\" \/><\/a><\/p>\n<div style=\"clear: both;\"><\/div>\n<p><a href=\"\/premium\/wp-content\/uploads\/2018china\/Testconxchinashenzhen2018s4p1wee_8157.pdf\" target=\"_blank\"><img loading=\"lazy\" decoding=\"async\" class=\"size-full wp-image-70\" alt=\"PDF-Icon 150x139\" src=\"\/premium\/wp-content\/uploads\/PDF-Icon-150x139.png\" width=\"75\" height=\"70\" \/><\/a>&nbsp;<a href=\"\/premium\/wp-content\/uploads\/2018china\/Testconxchinashenzhen2018s4p1wee_8157.pdf\" target=\"_blank\" \/>Presentation Download<\/a>\t\t\t\t<\/p>\n<div class=\"presentation\" id=\"s4p2\">\"Test yield control by on-line laser cleaning\"\n<\/div>\n<p>\n<strong>\"\u901a\u8fc7\u5728\u7ebf\u6fc0\u5149\u6e05\u6d01\u6765\u63a7\u5236\u6d4b\u8bd5\u826f\u7387\"<\/strong><br \/>\nJ.M. Lee<br \/>\nIMT Co. Ltd.<br \/>\nJ.W. Lee<br \/>\nIMT Co. Ltd.<\/p>\n<p><strong>\"Suzhou\"<\/strong><\/p>\n<div id=\"bits-video-69e1d762681e6\" class=\"s2member-jwplayer-v7\">Video Player Goes Here<\/div>\n<h4>Sorry, you do not NOT have access to this file.<\/h4>\n<p><strong>\"Shenzhen\"<\/strong><br \/>\n<a href=\"\/premium\/welcome\/\"><img loading=\"lazy\" decoding=\"async\" class=\"alignleft size-full wp-image-129\" title=\"Click here to subscribe to PREMIUM content\" alt=\"\" src=\"\/premium\/wp-content\/uploads\/premium-video-non-subscriber.png\" width=\"480\" height=\"270\" srcset=\"https:\/\/www.testconx.org\/premium\/wp-content\/uploads\/premium-video-non-subscriber.png 480w, https:\/\/www.testconx.org\/premium\/wp-content\/uploads\/premium-video-non-subscriber-300x168.png 300w\" sizes=\"auto, (max-width: 480px) 100vw, 480px\" \/><\/a><\/p>\n<div style=\"clear: both;\"><\/div>\n<p><a href=\"\/premium\/wp-content\/uploads\/2018china\/Testconxchinashenzhen2018s4p2lee_3467.pdf\" target=\"_blank\"><img loading=\"lazy\" decoding=\"async\" class=\"size-full wp-image-70\" alt=\"PDF-Icon 150x139\" src=\"\/premium\/wp-content\/uploads\/PDF-Icon-150x139.png\" width=\"75\" height=\"70\" \/><\/a>&nbsp;<a href=\"\/premium\/wp-content\/uploads\/2018china\/Testconxchinashenzhen2018s4p2lee_3467.pdf\" target=\"_blank\" \/>Presentation Download<\/a>  <\/p>\n<div class=\"presentation\" id=\"s4p3\">\"Additive Manufacturing Capability Study for Semiconductor Test Components\"<\/p>\n<\/div>\n<p>\n<strong>\"\u534a\u5bfc\u4f53\u6d4b\u8bd5\u5143\u4ef6\u7684\u589e\u503c\u5236\u9020\u80fd\u529b\u7814\u7a76\"<\/strong><br \/>\nCody Jacob<br \/>\nTest Tooling Solutions Group<\/p>\n<p><strong>\"Suzhou\"<\/strong><\/p>\n<div id=\"bits-video-69e1d76268bd4\" class=\"s2member-jwplayer-v7\">Video Player Goes Here<\/div>\n<h4>Sorry, you do not NOT have access to this file.<\/h4>\n<p><strong>\"Shenzhen\"<\/strong><br \/>\n<a href=\"\/premium\/welcome\/\"><img loading=\"lazy\" decoding=\"async\" class=\"alignleft size-full wp-image-129\" title=\"Click here to subscribe to PREMIUM content\" alt=\"\" src=\"\/premium\/wp-content\/uploads\/premium-video-non-subscriber.png\" width=\"480\" height=\"270\" srcset=\"https:\/\/www.testconx.org\/premium\/wp-content\/uploads\/premium-video-non-subscriber.png 480w, https:\/\/www.testconx.org\/premium\/wp-content\/uploads\/premium-video-non-subscriber-300x168.png 300w\" sizes=\"auto, (max-width: 480px) 100vw, 480px\" \/><\/a><\/p>\n<div style=\"clear: both;\"><\/div>\n<p><a href=\"\/premium\/wp-content\/uploads\/2018china\/Testconxchinashenzhen2018s4p3jacob_5721.pdf\" target=\"_blank\"><img loading=\"lazy\" decoding=\"async\" class=\"size-full wp-image-70\" alt=\"PDF-Icon 150x139\" src=\"\/premium\/wp-content\/uploads\/PDF-Icon-150x139.png\" width=\"75\" height=\"70\" \/><\/a>&nbsp;<a href=\"\/premium\/wp-content\/uploads\/2018china\/Testconxchinashenzhen2018s4p3jacob_5721.pdf\" target=\"_blank\" \/>Presentation Download<\/a><\/p>\n<p>&nbsp;<\/br><br \/>\nReturn to the 2018 TestConX China archive <a title=\"Return to 2018 TestConX Index\" href=\"https:\/\/www.testconx.org\/premium\/testconx-china-2018\/\">index page<\/a><\/p>\n","protected":false},"excerpt":{"rendered":"<p>&#8220;The Impact on Probe Pin Performance of Different Plunger Cutting Methods at Device Side&#8221; &#8220;\u51a0\u88c5\u63a2\u9488\u7684\u7c97\u7cd9\u9762\u5bf9\u63a2\u9488\u6027\u80fd\u7684\u5f71\u54cd&#8221; Roger McAleenan Advantest Alfred Lim Test Tooling Solutions Group Takuto Yoshida Test Tooling Solutions Group &#8220;Suzhou&#8221; Video Player Goes Here Sorry, you do not NOT have access to this file. &#8220;Shenzhen&#8221; &nbsp;Presentation Download &#8220;Test yield control by on-line laser cleaning&#8221; &#8220;\u901a\u8fc7\u5728\u7ebf\u6fc0\u5149\u6e05\u6d01\u6765\u63a7\u5236\u6d4b\u8bd5\u826f\u7387&#8221; J.M. Lee IMT Co. &#8230; <\/p>\n<div><a href=\"https:\/\/www.testconx.org\/premium\/2018\/testconx-china-2018-session-4\/\" class=\"more-link\">Read More<\/a><\/div>\n","protected":false},"author":548,"featured_media":0,"comment_status":"closed","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"footnotes":""},"categories":[17],"tags":[],"class_list":["post-3153","post","type-post","status-publish","format-standard","hentry","category-testconxchina2018","no-post-thumbnail"],"_links":{"self":[{"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/posts\/3153","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/users\/548"}],"replies":[{"embeddable":true,"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/comments?post=3153"}],"version-history":[{"count":5,"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/posts\/3153\/revisions"}],"predecessor-version":[{"id":3255,"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/posts\/3153\/revisions\/3255"}],"wp:attachment":[{"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/media?parent=3153"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/categories?post=3153"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/tags?post=3153"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}