{"id":3013,"date":"2018-03-09T20:39:39","date_gmt":"2018-03-10T04:39:39","guid":{"rendered":"https:\/\/www.testconx.org\/premium\/?p=3013"},"modified":"2023-05-15T09:58:50","modified_gmt":"2023-05-15T16:58:50","slug":"bits-2018-tutorial","status":"publish","type":"post","link":"https:\/\/www.testconx.org\/premium\/2018\/bits-2018-tutorial\/","title":{"rendered":"BiTS 2018 Tutorials"},"content":{"rendered":"\n<div class=\"presentation\">\n<h3>\"Testing and Selecting Thermal Interface Materials for Semiconductor Test and Burn-In\"<\/h3>\n<\/div>\n<p><strong>David L. Saums<\/strong><br \/>\nPrincipal & FounderPresident<br \/>\nDS&A LLC<\/p>\n\n<a href=\"\/premium\/welcome\/\"><img loading=\"lazy\" decoding=\"async\" class=\"alignleft size-full wp-image-129\" title=\"Click payment button ABOVE to upgrade to access Tutorial. For additional information on subscriptions, please click here.\" alt=\"\" src=\"\/premium\/wp-content\/uploads\/tutorial-video.png\" width=\"480\" height=\"270\" \/><\/a><\/p>\n<div style=\"clear: both;\"><\/div>\n<p>Upgrade for instant access using payment button above (when signed in).\n<div style=\"clear: both;\"><\/div>\n<p><a href=\"\/premium\/wp-content\/uploads\/2018\/BiTS2018Tutorial1-Saums_1337.pdf\" target=\"_blank\"><img loading=\"lazy\" decoding=\"async\" class=\"size-full wp-image-70\" alt=\"PDF-Icon 150x139\" src=\"\/premium\/wp-content\/uploads\/PDF-Icon-150x139.png\" width=\"75\" height=\"70\" \/><\/a>&nbsp;<a href=\"\/premium\/wp-content\/uploads\/2018\/BiTS2018Tutorial1-Saums_1337.pdf\" target=\"_blank\" \/>Presentation Download<\/a><\/p>\n<div class=\"presentation\">\n<h3>\"Connecting Your DUT to Your Tester\"<\/h3>\n<\/div>\n<p><strong>Tom Bresnan<\/strong><br \/>\nAccount Manager & Technical Sales<br \/>\nR&D Altanova<\/p>\n\n<a href=\"\/premium\/welcome\/\"><img loading=\"lazy\" decoding=\"async\" class=\"alignleft size-full wp-image-129\" title=\"Click payment button ABOVE to upgrade to access Tutorial. For additional information on subscriptions, please click here.\" alt=\"\" src=\"\/premium\/wp-content\/uploads\/tutorial-video.png\" width=\"480\" height=\"270\" \/><\/a><\/p>\n<div style=\"clear: both;\"><\/div>\n<p>Upgrade for instant access using payment button above (when signed in).\n<div style=\"clear: both;\"><\/div>\n<p><a href=\"\/premium\/wp-content\/uploads\/2018\/BiTS2018Tutorial2-Bresnan_4590.pdf\" target=\"_blank\"><img loading=\"lazy\" decoding=\"async\" class=\"size-full wp-image-70\" alt=\"PDF-Icon 150x139\" src=\"\/premium\/wp-content\/uploads\/PDF-Icon-150x139.png\" width=\"75\" height=\"70\" \/><\/a>&nbsp;<a href=\"\/premium\/wp-content\/uploads\/2018\/BiTS2018Tutorial2-Bresnan_4590.pdf\" target=\"_blank\" \/>Presentation Download<\/a><br \/>\n<br \/>&nbsp;<\/br><br \/>\nReturn to the 2018 BiTS Workshop Archive <a title=\"Return to 2018 Index\" href=\"\/premium\/premium\/bits2018-sunday\">index page<\/a><\/p>\n","protected":false},"excerpt":{"rendered":"<p>&#8220;Testing and Selecting Thermal Interface Materials for Semiconductor Test and Burn-In&#8221; David L. Saums Principal &#038; FounderPresident DS&#038;A LLC &nbsp;Presentation Download &#8220;Connecting Your DUT to Your Tester&#8221; Tom Bresnan Account Manager &#038; Technical Sales R&#038;D Altanova &nbsp;Presentation Download &nbsp; Return to the 2018 BiTS Workshop Archive index page<\/p>\n","protected":false},"author":548,"featured_media":0,"comment_status":"closed","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"footnotes":""},"categories":[16],"tags":[],"class_list":["post-3013","post","type-post","status-publish","format-standard","hentry","category-bits2018","no-post-thumbnail"],"_links":{"self":[{"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/posts\/3013","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/users\/548"}],"replies":[{"embeddable":true,"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/comments?post=3013"}],"version-history":[{"count":13,"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/posts\/3013\/revisions"}],"predecessor-version":[{"id":4535,"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/posts\/3013\/revisions\/4535"}],"wp:attachment":[{"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/media?parent=3013"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/categories?post=3013"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/tags?post=3013"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}