{"id":2401,"date":"2017-09-07T10:00:22","date_gmt":"2017-09-07T17:00:22","guid":{"rendered":"https:\/\/www.testconx.org\/premium\/?p=2401"},"modified":"2023-05-15T09:58:50","modified_gmt":"2023-05-15T16:58:50","slug":"bits-china-2017-session-1","status":"publish","type":"post","link":"https:\/\/www.testconx.org\/premium\/2017\/bits-china-2017-session-1\/","title":{"rendered":"BiTS China 2017 Session 1"},"content":{"rendered":"
\"High Speed Testing\"\n<\/div>\n

\"\u9ad8\u9891\u6d4b\u8bd5\"<\/strong>
\nJackie Luo
\nShanghai Zenfocus Semi-Tech Co., Ltd<\/p>\n

\"\"<\/a><\/p>\n

<\/div>\n

\"PDF-Icon<\/a> Presentation Download<\/a> <\/p>\n

\"Flat Probe Technology for RF Test\"\n<\/div>\n

\"\u9ad8\u9891\u6d4b\u8bd5\u7528\u6241\u5e73\u578b\u63a2\u9488\"<\/strong><\/p>\n

Dongmei Han
\nXcerra
\nJason Mroczkowski
\nXcerra
\nNadia Steckler
\nXcerra<\/p>\n

\"\"<\/a><\/p>\n

<\/div>\n

\"PDF-Icon<\/a> Presentation Download<\/a><\/p>\n

\"Coplanar Waveguide On Wafer Calibration Technology for Enabling High Volume Microwave On-Wafer Test\"\n<\/div>\n

\"\u5171\u9762\u6ce2\u5bfc\u5728\u7247\u6821\u51c6\u6280\u672f\u4f7f\u5fae\u6ce2\u96c6\u6210\u7535\u8def\u5728\u7247\u91cf\u6d4b\u6210\u4e3a\u53ef\u80fd\"<\/strong>
\nYuzhe Yin
\nChina Electronics Standardization Institute<\/p>\n

\"\"<\/a><\/p>\n

<\/div>\n

\"PDF-Icon<\/a> Presentation Download<\/a><\/p>\n

\"DUT ATE Test Fixture S-Parameters Estimation using 1x-Reflect Methodology\"\n<\/div>\n

\"\u91c7\u7528 1x-\u53cd\u5c04\u6cd5\u89e3\u6790\u82af\u7247\u81ea\u52a8\u6d4b\u8bd5\u5939\u5177\u7684 S-\u53c2\u6570\"<\/strong>
\nJose Moreira
\nAdvantest
\nChing-Chao Huang
\nAtaiTec Corporation
\nDerek Lee
\nNvidia<\/p>\n

\"\"<\/a><\/p>\n

<\/div>\n

\"PDF-Icon<\/a> Presentation Download<\/a><\/p>\n

\"Contactor Arcing Fundamentals\"\n<\/div>\n

\"\u89e6\u70b9\u62c9\u5f27\u57fa\u7840\"<\/strong>
\nYoinjun Shi
\nTwinSolution<\/p>\n

\"\"<\/a><\/p>\n

<\/div>\n

\"PDF-Icon<\/a> Presentation Download<\/a><\/p>\n

 <\/br>
\nReturn to the 2017 BiTS China Workshop Archive index page<\/a><\/p>\n","protected":false},"excerpt":{"rendered":"

“High Speed Testing” “\u9ad8\u9891\u6d4b\u8bd5” Jackie Luo Shanghai Zenfocus Semi-Tech Co., Ltd  Presentation Download “Flat Probe Technology for RF Test” “\u9ad8\u9891\u6d4b\u8bd5\u7528\u6241\u5e73\u578b\u63a2\u9488” Dongmei Han Xcerra Jason Mroczkowski Xcerra Nadia Steckler Xcerra  Presentation Download “Coplanar Waveguide On Wafer Calibration Technology for Enabling High Volume Microwave On-Wafer Test” “\u5171\u9762\u6ce2\u5bfc\u5728\u7247\u6821\u51c6\u6280\u672f\u4f7f\u5fae\u6ce2\u96c6\u6210\u7535\u8def\u5728\u7247\u91cf\u6d4b\u6210\u4e3a\u53ef\u80fd” Yuzhe Yin China Electronics Standardization Institute  Presentation Download “DUT ATE Test Fixture S-Parameters Estimation using … <\/p>\n

Read More<\/a><\/div>\n","protected":false},"author":548,"featured_media":0,"comment_status":"closed","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"footnotes":""},"categories":[15],"tags":[],"class_list":["post-2401","post","type-post","status-publish","format-standard","hentry","category-bits-china-2017","no-post-thumbnail"],"_links":{"self":[{"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/posts\/2401","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/users\/548"}],"replies":[{"embeddable":true,"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/comments?post=2401"}],"version-history":[{"count":4,"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/posts\/2401\/revisions"}],"predecessor-version":[{"id":2652,"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/posts\/2401\/revisions\/2652"}],"wp:attachment":[{"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/media?parent=2401"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/categories?post=2401"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/tags?post=2401"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}