
{"id":2399,"date":"2017-09-07T12:00:40","date_gmt":"2017-09-07T19:00:40","guid":{"rendered":"https:\/\/www.testconx.org\/premium\/?p=2399"},"modified":"2023-05-15T09:58:50","modified_gmt":"2023-05-15T16:58:50","slug":"bits-china-2017-session-2","status":"publish","type":"post","link":"https:\/\/www.testconx.org\/premium\/2017\/bits-china-2017-session-2\/","title":{"rendered":"BiTS China 2017 Session 2"},"content":{"rendered":"<div class=\"presentation\" id=\"s2p1\">\"The challenge of testing and burn-in for System in Package\"\n<\/div>\n<p>\n<strong>\"\u7cfb\u7edf\u7ea7\u5c01\u88c5\u82af\u7247\u7684\u6d4b\u8bd5\u53ca\u8001\u5316\u5b9e\u9a8c\u7684\u6311\u6218\"<\/strong><br \/>\nLeo Wang<br \/>\nISE Labs, member of ASE Group<br \/>\n<img decoding=\"async\" src=\"\/premium\/wp-content\/uploads\/bestpaper.png\" alt=\"\" \/><\/p>\n<p><a href=\"\/premium\/welcome\/\"><img loading=\"lazy\" decoding=\"async\" class=\"alignleft size-full wp-image-129\" title=\"Click here to subscribe to PREMIUM content\" alt=\"\" src=\"\/premium\/wp-content\/uploads\/premium-video-non-subscriber.png\" width=\"480\" height=\"270\" srcset=\"https:\/\/www.testconx.org\/premium\/wp-content\/uploads\/premium-video-non-subscriber.png 480w, https:\/\/www.testconx.org\/premium\/wp-content\/uploads\/premium-video-non-subscriber-300x168.png 300w\" sizes=\"auto, (max-width: 480px) 100vw, 480px\" \/><\/a><\/p>\n<div style=\"clear: both;\"><\/div>\n<p><a href=\"\/premium\/wp-content\/uploads\/2017china\/BiTSChina2017s0p1Tut_8589.pdf\" target=\"_blank\"><img loading=\"lazy\" decoding=\"async\" class=\"size-full wp-image-70\" alt=\"PDF-Icon 150x139\" src=\"\/premium\/wp-content\/uploads\/PDF-Icon-150x139.png\" width=\"75\" height=\"70\" \/><\/a>&nbsp;<a href=\"\/premium\/wp-content\/uploads\/2017china\/BiTSChina2017s0p1Tut_8589.pdf\" target=\"_blank\" \/>Presentation Download<\/a>\t\t\t\t<\/p>\n<div class=\"presentation\" id=\"s2p2\">\"Socket Material Characterization & Selection\"\n<\/div>\n<p>\n<strong>\"\u82af\u7247\u6d4b\u8bd5\u63d2\u5ea7\u6750\u6599\u7279\u6027\u548c\u5e94\u7528\"<\/strong><br \/>\nJinrong \"Cleveland\" Chen<br \/>\nSmiths Interconnect<br \/>\nJiachun \"Frank\" Zhou<br \/>\nSmiths Interconnect<\/p>\n<p><a href=\"\/premium\/welcome\/\"><img loading=\"lazy\" decoding=\"async\" class=\"alignleft size-full wp-image-129\" title=\"Click here to subscribe to PREMIUM content\" alt=\"\" src=\"\/premium\/wp-content\/uploads\/premium-video-non-subscriber.png\" width=\"480\" height=\"270\" srcset=\"https:\/\/www.testconx.org\/premium\/wp-content\/uploads\/premium-video-non-subscriber.png 480w, https:\/\/www.testconx.org\/premium\/wp-content\/uploads\/premium-video-non-subscriber-300x168.png 300w\" sizes=\"auto, (max-width: 480px) 100vw, 480px\" \/><\/a><\/p>\n<div style=\"clear: both;\"><\/div>\n<p><a href=\"\/premium\/wp-content\/uploads\/2017china\/BiTSChina2017s2p2Chen_5895.pdf\" target=\"_blank\"><img loading=\"lazy\" decoding=\"async\" class=\"size-full wp-image-70\" alt=\"PDF-Icon 150x139\" src=\"\/premium\/wp-content\/uploads\/PDF-Icon-150x139.png\" width=\"75\" height=\"70\" \/><\/a>&nbsp;<a href=\"\/premium\/wp-content\/uploads\/2017china\/BiTSChina2017s2p2Chen_5895.pdf\" target=\"_blank\" \/>Presentation Download<\/a>  <\/p>\n<div class=\"presentation\" id=\"s2p3\">\"Deterministic contact resistance of BGA contact pins\"<\/p>\n<\/div>\n<p>\n<strong>\"BGA \u6d4b\u8bd5\u63a2\u9488\u7684\u63a5\u89e6\u7535\u963b\u7814\u7a76\"<\/strong><br \/>\nTerry Wang<br \/>\nInfineon<br \/>\nPraveen kumar Ramamoorthy<br \/>\nInfineon<br \/>\nYusman Sugianto<br \/>\nInfineon<\/p>\n<p> <a href=\"\/premium\/welcome\/\"><img loading=\"lazy\" decoding=\"async\" class=\"alignleft size-full wp-image-129\" title=\"Click here to subscribe to PREMIUM content\" alt=\"\" src=\"\/premium\/wp-content\/uploads\/premium-video-non-subscriber.png\" width=\"480\" height=\"270\" srcset=\"https:\/\/www.testconx.org\/premium\/wp-content\/uploads\/premium-video-non-subscriber.png 480w, https:\/\/www.testconx.org\/premium\/wp-content\/uploads\/premium-video-non-subscriber-300x168.png 300w\" sizes=\"auto, (max-width: 480px) 100vw, 480px\" \/><\/a><\/p>\n<div style=\"clear: both;\"><\/div>\n<p><a href=\"\/premium\/wp-content\/uploads\/2017china\/BiTSChina2017s2p3Wang_6285.pdf\" target=\"_blank\"><img loading=\"lazy\" decoding=\"async\" class=\"size-full wp-image-70\" alt=\"PDF-Icon 150x139\" src=\"\/premium\/wp-content\/uploads\/PDF-Icon-150x139.png\" width=\"75\" height=\"70\" \/><\/a>&nbsp;<a href=\"\/premium\/wp-content\/uploads\/2017china\/BiTSChina2017s2p3Wang_6285.pdf\" target=\"_blank\" \/>Presentation Download<\/a><\/p>\n<div class=\"presentation\" id=\"s2p4\">\"New universal multi-beam Kelvin contactor concept for turret applications\"\n<\/div>\n<p>\n<strong>\"\u65b0\u578b\u591a\u529f\u80fd\u5f00\u5c14\u6587\u63a5\u89e6\u63a2\u9488\u8bbe\u8ba1\"<\/strong><br \/>\nMathias Westenhuber<br \/>\nCohu<br \/>\nJohann P\u00f6tzinger<br \/>\nCohu<\/p>\n<p> <a href=\"\/premium\/welcome\/\"><img loading=\"lazy\" decoding=\"async\" class=\"alignleft size-full wp-image-129\" title=\"Click here to subscribe to PREMIUM content\" alt=\"\" src=\"\/premium\/wp-content\/uploads\/premium-video-non-subscriber.png\" width=\"480\" height=\"270\" srcset=\"https:\/\/www.testconx.org\/premium\/wp-content\/uploads\/premium-video-non-subscriber.png 480w, https:\/\/www.testconx.org\/premium\/wp-content\/uploads\/premium-video-non-subscriber-300x168.png 300w\" sizes=\"auto, (max-width: 480px) 100vw, 480px\" \/><\/a><\/p>\n<div style=\"clear: both;\"><\/div>\n<p><a href=\"\/premium\/wp-content\/uploads\/2017china\/BiTSChina2017s2p4Westenhuber_6410.pdf\" target=\"_blank\"><img loading=\"lazy\" decoding=\"async\" class=\"size-full wp-image-70\" alt=\"PDF-Icon 150x139\" src=\"\/premium\/wp-content\/uploads\/PDF-Icon-150x139.png\" width=\"75\" height=\"70\" \/><\/a>&nbsp;<a href=\"\/premium\/wp-content\/uploads\/2017china\/BiTSChina2017s2p4Westenhuber_6410.pdf\" target=\"_blank\" \/>Presentation Download<\/a><\/p>\n<p>&nbsp;<\/br><br \/>\nReturn to the 2017 BiTS China Workshop Archive <a title=\"Return to 2017 BiTS China BiTS Index\" href=\"https:\/\/www.testconx.org\/premium\/bits-china-2017\/\">index page<\/a><\/p>\n","protected":false},"excerpt":{"rendered":"<p>&#8220;The challenge of testing and burn-in for System in Package&#8221; &#8220;\u7cfb\u7edf\u7ea7\u5c01\u88c5\u82af\u7247\u7684\u6d4b\u8bd5\u53ca\u8001\u5316\u5b9e\u9a8c\u7684\u6311\u6218&#8221; Leo Wang ISE Labs, member of ASE Group &nbsp;Presentation Download &#8220;Socket Material Characterization &#038; Selection&#8221; &#8220;\u82af\u7247\u6d4b\u8bd5\u63d2\u5ea7\u6750\u6599\u7279\u6027\u548c\u5e94\u7528&#8221; Jinrong &#8220;Cleveland&#8221; Chen Smiths Interconnect Jiachun &#8220;Frank&#8221; Zhou Smiths Interconnect &nbsp;Presentation Download &#8220;Deterministic contact resistance of BGA contact pins&#8221; &#8220;BGA \u6d4b\u8bd5\u63a2\u9488\u7684\u63a5\u89e6\u7535\u963b\u7814\u7a76&#8221; Terry Wang Infineon Praveen kumar Ramamoorthy Infineon Yusman Sugianto Infineon &nbsp;Presentation Download &#8230; <\/p>\n<div><a href=\"https:\/\/www.testconx.org\/premium\/2017\/bits-china-2017-session-2\/\" class=\"more-link\">Read More<\/a><\/div>\n","protected":false},"author":548,"featured_media":0,"comment_status":"closed","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"footnotes":""},"categories":[15],"tags":[],"class_list":["post-2399","post","type-post","status-publish","format-standard","hentry","category-bits-china-2017","no-post-thumbnail"],"_links":{"self":[{"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/posts\/2399","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/users\/548"}],"replies":[{"embeddable":true,"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/comments?post=2399"}],"version-history":[{"count":3,"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/posts\/2399\/revisions"}],"predecessor-version":[{"id":2650,"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/posts\/2399\/revisions\/2650"}],"wp:attachment":[{"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/media?parent=2399"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/categories?post=2399"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/tags?post=2399"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}