{"id":2132,"date":"2017-03-08T23:00:48","date_gmt":"2017-03-09T07:00:48","guid":{"rendered":"https:\/\/www.testconx.org\/premium\/?p=2132"},"modified":"2023-05-15T09:59:07","modified_gmt":"2023-05-15T16:59:07","slug":"awards-closing-2017","status":"publish","type":"post","link":"https:\/\/www.testconx.org\/premium\/2017\/awards-closing-2017\/","title":{"rendered":"Awards &#038; Closing 2017"},"content":{"rendered":"<div class=\"presentation\" id=\"s8p1\">\"Awards & Closing Remarks\"<\/div>\n<p><\/p>\n<p><script src=\"https:\/\/cdn.jwplayer.com\/libraries\/eO3bkuSw.js?exp=1778865238&sig=e35ac34f97b555206180722fd3959f93\"> <\/script><\/p>\n<div id=\"bits-video-6a0751fea91df\" class=\"s2member-jwplayer-v7\">Video Player Goes Here<\/div>\n<div style=\"clear: both;\"><\/div>\n<p><a href=\"\/premium\/wp-content\/uploads\/2017\/BiTS2017AwardsClosing_1337.pdf\" target=\"_blank\"><img loading=\"lazy\" decoding=\"async\" class=\"size-full wp-image-70\" alt=\"PDF-Icon 150x139\" src=\"\/premium\/wp-content\/uploads\/PDF-Icon-150x139.png\" width=\"75\" height=\"70\" \/><\/a>&nbsp;<a href=\"\/premium\/wp-content\/uploads\/2017\/BiTS2017AwardsClosing_1337.pdf\" target=\"_blank\" \/>Presentation Download<\/a><\/p>\n<p><strong>Best Presentation <\/strong><br \/>\n\"Contactor Based Final Test at 77 GHz on a Multi-Channel Radar Transceiver Chipset\"<\/p>\n<p>Brian Nakai<br \/>\nNXP Semiconductors<\/p>\n<p>Jeffrey Finder<br \/>\nNXP Semiconductors<\/p>\n<p><a href=\"\/premium\/welcome\/\"><img loading=\"lazy\" decoding=\"async\" class=\"alignleft size-full wp-image-129\" title=\"Click here to subscribe to PREMIUM content\" alt=\"\" src=\"\/premium\/wp-content\/uploads\/premium-video-non-subscriber.png\" width=\"480\" height=\"270\" srcset=\"https:\/\/www.testconx.org\/premium\/wp-content\/uploads\/premium-video-non-subscriber.png 480w, https:\/\/www.testconx.org\/premium\/wp-content\/uploads\/premium-video-non-subscriber-300x168.png 300w\" sizes=\"auto, (max-width: 480px) 100vw, 480px\" \/><\/a><\/p>\n<div style=\"clear: both;\"><\/div>\n<p><a href=\"\/premium\/wp-content\/uploads\/2017\/BiTS2017s1p4Nakai_4908.pdf\" target=\"_blank\"><img loading=\"lazy\" decoding=\"async\" class=\"size-full wp-image-70\" alt=\"PDF-Icon 150x139\" src=\"\/premium\/wp-content\/uploads\/PDF-Icon-150x139.png\" width=\"75\" height=\"70\" \/><\/a>&nbsp;<a href=\"\/premium\/wp-content\/uploads\/2017\/BiTS2017s1p4Nakai_4908.pdf\" target=\"_blank\" \/>Presentation Download<\/a><br \/>\n<strong>Best Data<\/strong><br \/>\n\"High Current Final Test Contactor Development\"<\/p>\n<p>Thiha Shwe<br \/>\nTexas Instruments<br \/>\nHisashi Ata<br \/>\nTexas Instruments<br \/>\nKenichi Sato<br \/>\nYokowo<\/p>\n<p><a href=\"\/premium\/welcome\/\"><img loading=\"lazy\" decoding=\"async\" class=\"alignleft size-full wp-image-129\" title=\"Click here to subscribe to PREMIUM content\" alt=\"\" src=\"\/premium\/wp-content\/uploads\/premium-video-non-subscriber.png\" width=\"480\" height=\"270\" srcset=\"https:\/\/www.testconx.org\/premium\/wp-content\/uploads\/premium-video-non-subscriber.png 480w, https:\/\/www.testconx.org\/premium\/wp-content\/uploads\/premium-video-non-subscriber-300x168.png 300w\" sizes=\"auto, (max-width: 480px) 100vw, 480px\" \/><\/a><\/p>\n<div style=\"clear: both;\"><\/div>\n<p><a href=\"\/premium\/wp-content\/uploads\/2017\/BiTS2017s6p1Shwe_8574.pdf\" target=\"_blank\"><img loading=\"lazy\" decoding=\"async\" class=\"size-full wp-image-70\" alt=\"PDF-Icon 150x139\" src=\"\/premium\/wp-content\/uploads\/PDF-Icon-150x139.png\" width=\"75\" height=\"70\" \/><\/a>&nbsp;<a href=\"\/premium\/wp-content\/uploads\/2017\/BiTS2017s6p1Shwe_8574.pdf\" target=\"_blank\" \/>Presentation Download<\/a><br \/>\n<strong>Most Inspirational <\/strong><br \/>\n\"New Possiblity with Coax Via Risers\"<br \/>\nMatthew Priolo<br \/>\nAdrian Rodriquez<br \/>\nChristopher Kinney<br \/>\nAdewale Oladeinde<br \/>\nIntel Corporation<\/p>\n<p><a href=\"\/premium\/welcome\/\"><img loading=\"lazy\" decoding=\"async\" class=\"alignleft size-full wp-image-129\" title=\"Click here to subscribe to PREMIUM content\" alt=\"\" src=\"\/premium\/wp-content\/uploads\/premium-video-non-subscriber.png\" width=\"480\" height=\"270\" srcset=\"https:\/\/www.testconx.org\/premium\/wp-content\/uploads\/premium-video-non-subscriber.png 480w, https:\/\/www.testconx.org\/premium\/wp-content\/uploads\/premium-video-non-subscriber-300x168.png 300w\" sizes=\"auto, (max-width: 480px) 100vw, 480px\" \/><\/a><\/p>\n<div style=\"clear: both;\"><\/div>\n<p><a href=\"\/premium\/wp-content\/uploads\/2017\/BiTS2017s3p2Priolo_9755.pdf\" target=\"_blank\"><img loading=\"lazy\" decoding=\"async\" class=\"size-full wp-image-70\" alt=\"PDF-Icon 150x139\" src=\"\/premium\/wp-content\/uploads\/PDF-Icon-150x139.png\" width=\"75\" height=\"70\" \/><\/a>&nbsp;<a href=\"\/premium\/wp-content\/uploads\/2017\/BiTS2017s3p2Priolo_9755.pdf\" target=\"_blank\" \/>Presentation Download<\/a><br \/>\n<strong>Most Educational<\/strong><br \/>\n\"Flat Probe Technology For High Frequency Test\"<br \/>\nJason Mroczkowski<br \/>\nXcerra<br \/>\nNadia Steckler<br \/>\nXcerra<\/p>\n<p><a href=\"\/premium\/welcome\/\"><img loading=\"lazy\" decoding=\"async\" class=\"alignleft size-full wp-image-129\" title=\"Click here to subscribe to PREMIUM content\" alt=\"\" src=\"\/premium\/wp-content\/uploads\/premium-video-non-subscriber.png\" width=\"480\" height=\"270\" srcset=\"https:\/\/www.testconx.org\/premium\/wp-content\/uploads\/premium-video-non-subscriber.png 480w, https:\/\/www.testconx.org\/premium\/wp-content\/uploads\/premium-video-non-subscriber-300x168.png 300w\" sizes=\"auto, (max-width: 480px) 100vw, 480px\" \/><\/a><\/p>\n<div style=\"clear: both;\"><\/div>\n<p><a href=\"\/premium\/wp-content\/uploads\/2017\/BiTS2017s8p3Mroczkowski_3638.pdf\" target=\"_blank\"><img loading=\"lazy\" decoding=\"async\" class=\"size-full wp-image-70\" alt=\"PDF-Icon 150x139\" src=\"\/premium\/wp-content\/uploads\/PDF-Icon-150x139.png\" width=\"75\" height=\"70\" \/><\/a>&nbsp;<a href=\"\/premium\/wp-content\/uploads\/2017\/BiTS2017s8p3Mroczkowski_3638.pdf\" target=\"_blank\" \/>Presentation Download<\/a><br \/>\n<strong>Attendee Choice<\/strong><br \/>\n\"Coming to terms with Burn-In sockets\"<\/p>\n<p>James Tong<br \/>\nTexas Instruments<\/p>\n<p><a href=\"\/premium\/welcome\/\"><img loading=\"lazy\" decoding=\"async\" class=\"alignleft size-full wp-image-129\" title=\"Click here to subscribe to PREMIUM content\" alt=\"\" src=\"\/premium\/wp-content\/uploads\/premium-video-non-subscriber.png\" width=\"480\" height=\"270\" srcset=\"https:\/\/www.testconx.org\/premium\/wp-content\/uploads\/premium-video-non-subscriber.png 480w, https:\/\/www.testconx.org\/premium\/wp-content\/uploads\/premium-video-non-subscriber-300x168.png 300w\" sizes=\"auto, (max-width: 480px) 100vw, 480px\" \/><\/a><\/p>\n<div style=\"clear: both;\"><\/div>\n<p><a href=\"\/premium\/wp-content\/uploads\/2017\/BiTS2017s6p4Tong_6065.pdf\" target=\"_blank\"><img loading=\"lazy\" decoding=\"async\" class=\"size-full wp-image-70\" alt=\"PDF-Icon 150x139\" src=\"\/premium\/wp-content\/uploads\/PDF-Icon-150x139.png\" width=\"75\" height=\"70\" \/><\/a>&nbsp;<a href=\"\/premium\/wp-content\/uploads\/2017\/BiTS2017s6p4Tong_6065.pdf\" target=\"_blank\" \/>Presentation Download<\/a><br \/>\n<strong>Best Poster<\/strong><br \/>\n\"Low Cost \/ Low Profile Spring Probe\"<br \/>\nSamuel Pak<br \/>\nIWIN Co., Ltd.<\/p>\n<div style=\"clear: both;\"><\/div>\n<p><a href=\"\/premium\/wp-content\/uploads\/2017\/BiTS2017poster13PakSamuel_1813.pdf\" target=\"_blank\"><img loading=\"lazy\" decoding=\"async\" class=\"size-full wp-image-70\" alt=\"PDF-Icon 150x139\" src=\"\/premium\/wp-content\/uploads\/PDF-Icon-150x139.png\" width=\"75\" height=\"70\" \/><\/a>&nbsp;<a href=\"\/premium\/wp-content\/uploads\/2017\/BiTS2017poster13PakSamuel_1813.pdf\" target=\"_blank\" \/>Poster Download<\/a><br \/>\n<br \/>&nbsp;<\/br><br \/>\nReturn to the 2017 BiTS Workshop Archive <a title=\"Return to 2017 Index\" href=\"\/premium\/bits-workshop-2017-event-archive\">index page<\/a><\/p>\n","protected":false},"excerpt":{"rendered":"<p>&#8220;Awards &#038; Closing Remarks&#8221; Video Player Goes Here &nbsp;Presentation Download Best Presentation &#8220;Contactor Based Final Test at 77 GHz on a Multi-Channel Radar Transceiver Chipset&#8221; Brian Nakai NXP Semiconductors Jeffrey Finder NXP Semiconductors &nbsp;Presentation Download Best Data &#8220;High Current Final Test Contactor Development&#8221; Thiha Shwe Texas Instruments Hisashi Ata Texas Instruments Kenichi Sato Yokowo &nbsp;Presentation Download Most Inspirational &#8220;New Possiblity &#8230; <\/p>\n<div><a href=\"https:\/\/www.testconx.org\/premium\/2017\/awards-closing-2017\/\" class=\"more-link\">Read More<\/a><\/div>\n","protected":false},"author":548,"featured_media":0,"comment_status":"closed","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"footnotes":""},"categories":[14],"tags":[],"class_list":["post-2132","post","type-post","status-publish","format-standard","hentry","category-bits2017","no-post-thumbnail"],"_links":{"self":[{"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/posts\/2132","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/users\/548"}],"replies":[{"embeddable":true,"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/comments?post=2132"}],"version-history":[{"count":15,"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/posts\/2132\/revisions"}],"predecessor-version":[{"id":2783,"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/posts\/2132\/revisions\/2783"}],"wp:attachment":[{"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/media?parent=2132"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/categories?post=2132"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/tags?post=2132"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}