
{"id":1955,"date":"2017-03-08T10:30:19","date_gmt":"2017-03-08T18:30:19","guid":{"rendered":"https:\/\/www.testconx.org\/premium\/?p=1955"},"modified":"2023-05-15T09:59:07","modified_gmt":"2023-05-15T16:59:07","slug":"bits-2017-session-8","status":"publish","type":"post","link":"https:\/\/www.testconx.org\/premium\/2017\/bits-2017-session-8\/","title":{"rendered":"BiTS 2017 Session 8"},"content":{"rendered":"<div class=\"presentation\" id=\"s8p1\">\"Small Form Factor Cantilever Concepts for High Performance Analog \/ RF Applications\"<\/div>\n<p>\nGerhard Gschwendtberger<br \/>\nCohu<\/p>\n<p><a href=\"\/premium\/welcome\/\"><img loading=\"lazy\" decoding=\"async\" class=\"alignleft size-full wp-image-129\" title=\"Click here to subscribe to PREMIUM content\" alt=\"\" src=\"\/premium\/wp-content\/uploads\/premium-video-non-subscriber.png\" width=\"480\" height=\"270\" srcset=\"https:\/\/www.testconx.org\/premium\/wp-content\/uploads\/premium-video-non-subscriber.png 480w, https:\/\/www.testconx.org\/premium\/wp-content\/uploads\/premium-video-non-subscriber-300x168.png 300w\" sizes=\"auto, (max-width: 480px) 100vw, 480px\" \/><\/a><\/p>\n<div style=\"clear: both;\"><\/div>\n<p><a href=\"\/premium\/wp-content\/uploads\/2017\/BiTS2017s8p1Gschwentberger_9312.pdf\" target=\"_blank\"><img loading=\"lazy\" decoding=\"async\" class=\"size-full wp-image-70\" alt=\"PDF-Icon 150x139\" src=\"\/premium\/wp-content\/uploads\/PDF-Icon-150x139.png\" width=\"75\" height=\"70\" \/><\/a>&nbsp;<a href=\"\/premium\/wp-content\/uploads\/2017\/BiTS2017s8p1Gschwentberger_9312.pdf\" target=\"_blank\" \/>Presentation Download<\/a><\/p>\n<div class=\"presentation\" id=\"s8p2\">\"MRC (MEMS Rubber Contact) Socket Bump Particle Structure & Performance Analysis\"<\/div>\n<p>\nBoHyun Kim<br \/>\nTSE Co,.Ltd<br \/>\nDave Oh<br \/>\nTSE Co, ltd<br \/>\nJustin Yun<br \/>\nTSE Co, ltd<\/p>\n<p><a href=\"\/premium\/welcome\/\"><img loading=\"lazy\" decoding=\"async\" class=\"alignleft size-full wp-image-129\" title=\"Click here to subscribe to PREMIUM content\" alt=\"\" src=\"\/premium\/wp-content\/uploads\/premium-video-non-subscriber.png\" width=\"480\" height=\"270\" srcset=\"https:\/\/www.testconx.org\/premium\/wp-content\/uploads\/premium-video-non-subscriber.png 480w, https:\/\/www.testconx.org\/premium\/wp-content\/uploads\/premium-video-non-subscriber-300x168.png 300w\" sizes=\"auto, (max-width: 480px) 100vw, 480px\" \/><\/a><\/p>\n<div style=\"clear: both;\"><\/div>\n<p><a href=\"\/premium\/wp-content\/uploads\/2017\/BiTS2017s8p2Yun_8232.pdf\" target=\"_blank\"><img loading=\"lazy\" decoding=\"async\" class=\"size-full wp-image-70\" alt=\"PDF-Icon 150x139\" src=\"\/premium\/wp-content\/uploads\/PDF-Icon-150x139.png\" width=\"75\" height=\"70\" \/><\/a>&nbsp;<a href=\"\/premium\/wp-content\/uploads\/2017\/BiTS2017s8p2Yun_8232.pdf\" target=\"_blank\" \/>Presentation Download<\/a><\/p>\n<div class=\"presentation\" id=\"s8p3\">\"Flat Probe Technology For High Frequency Test\"<\/div>\n<p>\nJason Mroczkowski<br \/>\nXcerra<br \/>\nNadia Steckler<br \/>\nXcerra<\/p>\n<p><a href=\"\/premium\/welcome\/\"><img loading=\"lazy\" decoding=\"async\" class=\"alignleft size-full wp-image-129\" title=\"Click here to subscribe to PREMIUM content\" alt=\"\" src=\"\/premium\/wp-content\/uploads\/premium-video-non-subscriber.png\" width=\"480\" height=\"270\" srcset=\"https:\/\/www.testconx.org\/premium\/wp-content\/uploads\/premium-video-non-subscriber.png 480w, https:\/\/www.testconx.org\/premium\/wp-content\/uploads\/premium-video-non-subscriber-300x168.png 300w\" sizes=\"auto, (max-width: 480px) 100vw, 480px\" \/><\/a><\/p>\n<div style=\"clear: both;\"><\/div>\n<p><a href=\"\/premium\/wp-content\/uploads\/2017\/BiTS2017s8p3Mroczkowski_3638.pdf\" target=\"_blank\"><img loading=\"lazy\" decoding=\"async\" class=\"size-full wp-image-70\" alt=\"PDF-Icon 150x139\" src=\"\/premium\/wp-content\/uploads\/PDF-Icon-150x139.png\" width=\"75\" height=\"70\" \/><\/a>&nbsp;<a href=\"\/premium\/wp-content\/uploads\/2017\/BiTS2017s8p3Mroczkowski_3638.pdf\" target=\"_blank\" \/>Presentation Download<\/a><\/p>\n<p>&nbsp;<\/br><br \/>\nReturn to the 2017 BiTS Workshop Archive <a title=\"Return to 2017 Index\" href=\"\/premium\/bits-workshop-2017-event-archive\">index page<\/a><\/p>\n","protected":false},"excerpt":{"rendered":"<p>&#8220;Small Form Factor Cantilever Concepts for High Performance Analog \/ RF Applications&#8221; Gerhard Gschwendtberger Cohu &nbsp;Presentation Download &#8220;MRC (MEMS Rubber Contact) Socket Bump Particle Structure &#038; Performance Analysis&#8221; BoHyun Kim TSE Co,.Ltd Dave Oh TSE Co, ltd Justin Yun TSE Co, ltd &nbsp;Presentation Download &#8220;Flat Probe Technology For High Frequency Test&#8221; Jason Mroczkowski Xcerra Nadia Steckler Xcerra &nbsp;Presentation Download &nbsp; &#8230; <\/p>\n<div><a href=\"https:\/\/www.testconx.org\/premium\/2017\/bits-2017-session-8\/\" class=\"more-link\">Read More<\/a><\/div>\n","protected":false},"author":548,"featured_media":0,"comment_status":"closed","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"footnotes":""},"categories":[14],"tags":[],"class_list":["post-1955","post","type-post","status-publish","format-standard","hentry","category-bits2017","no-post-thumbnail"],"_links":{"self":[{"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/posts\/1955","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/users\/548"}],"replies":[{"embeddable":true,"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/comments?post=1955"}],"version-history":[{"count":11,"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/posts\/1955\/revisions"}],"predecessor-version":[{"id":3068,"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/posts\/1955\/revisions\/3068"}],"wp:attachment":[{"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/media?parent=1955"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/categories?post=1955"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/tags?post=1955"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}