{"id":1953,"date":"2017-03-08T08:00:21","date_gmt":"2017-03-08T16:00:21","guid":{"rendered":"https:\/\/www.testconx.org\/premium\/?p=1953"},"modified":"2023-05-15T09:59:07","modified_gmt":"2023-05-15T16:59:07","slug":"bits-2017-session-7","status":"publish","type":"post","link":"https:\/\/www.testconx.org\/premium\/2017\/bits-2017-session-7\/","title":{"rendered":"BiTS 2017 Session 7"},"content":{"rendered":"
\"Applying FEA Simulation for Test Interface Unit\"<\/div>\n

\nJason Koh
\nTest Tooling Solutions Group<\/p>\n

\"\"<\/a><\/p>\n

<\/div>\n

\"PDF-Icon<\/a> Presentation Download<\/a><\/p>\n

\"BI RHINO Handling Solution\"<\/div>\n

\nYaniv Raz
\nIntel<\/p>\n

\"\"<\/a><\/p>\n

<\/div>\n

\"PDF-Icon<\/a> Presentation Download<\/a><\/p>\n

\"Optical Device Testing at Wafer Level and Package Devices\"<\/div>\n

\nCarl Kasinski
\nAehr<\/p>\n

\"\"<\/a><\/p>\n

<\/div>\n

\"PDF-Icon<\/a> Presentation Download<\/a><\/p>\n

\"Fan-in WLCSP Test Requirements\"<\/div>\n

<\/p>\n

Mike Frazier
\nXcerra<\/p>\n

\"\"<\/a><\/p>\n

<\/div>\n

\"PDF-Icon<\/a> Presentation Download<\/a><\/p>\n

 <\/br><\/p>\n

Return to the 2017 BiTS Workshop Archive index page<\/a><\/h2>\n","protected":false},"excerpt":{"rendered":"

“Applying FEA Simulation for Test Interface Unit” Jason Koh Test Tooling Solutions Group  Presentation Download “BI RHINO Handling Solution” Yaniv Raz Intel  Presentation Download “Optical Device Testing at Wafer Level and Package Devices” Carl Kasinski Aehr  Presentation Download “Fan-in WLCSP Test Requirements” Mike Frazier Xcerra  Presentation Download   Return to the 2017 BiTS Workshop Archive index page<\/p>\n","protected":false},"author":548,"featured_media":0,"comment_status":"closed","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"footnotes":""},"categories":[14],"tags":[],"class_list":["post-1953","post","type-post","status-publish","format-standard","hentry","category-bits2017","no-post-thumbnail"],"_links":{"self":[{"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/posts\/1953","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/users\/548"}],"replies":[{"embeddable":true,"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/comments?post=1953"}],"version-history":[{"count":8,"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/posts\/1953\/revisions"}],"predecessor-version":[{"id":2316,"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/posts\/1953\/revisions\/2316"}],"wp:attachment":[{"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/media?parent=1953"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/categories?post=1953"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/tags?post=1953"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}