{"id":1949,"date":"2017-03-07T10:30:46","date_gmt":"2017-03-07T18:30:46","guid":{"rendered":"https:\/\/www.testconx.org\/premium\/?p=1949"},"modified":"2023-05-15T09:59:07","modified_gmt":"2023-05-15T16:59:07","slug":"bits-2017-session-5","status":"publish","type":"post","link":"https:\/\/www.testconx.org\/premium\/2017\/bits-2017-session-5\/","title":{"rendered":"BiTS 2017 Session 5"},"content":{"rendered":"
\"Process Improvements to Increase Burn-In Yield and Quality\"<\/div>\n

<\/p>\n

Jeanette Linn
\nTexas Instruments
\nRich Karr
\nTexas Instruments<\/p>\n

\"\"<\/a><\/p>\n

<\/div>\n

\"PDF-Icon<\/a> Presentation Download<\/a><\/p>\n

\"Device Characterization Over Temperature at the Board Level\"<\/div>\n

\nBarry Johnson
\ninTEST Thermal Solutions<\/p>\n

\"\"<\/a><\/p>\n

<\/div>\n

\"PDF-Icon<\/a> Presentation Download<\/a><\/p>\n

\"Qualifying A Process For Higher Burn-In Voltage Application\"<\/div>\n

<\/p>\n

Krishna Mohan Chavali
\nGlobalfoundries US Inc<\/p>\n

\"\"<\/a><\/p>\n

<\/div>\n

\"PDF-Icon<\/a> Presentation Download<\/a><\/p>\n

\"Coming Challenges and Opportunities for MEMS Testing Supply Chain\"<\/div>\n

<\/p>\n

Wendy Chen
\nKYEC<\/p>\n

\"\"<\/a><\/p>\n

<\/div>\n

\"PDF-Icon<\/a> Presentation Download<\/a><\/p>\n

 <\/br>
\nReturn to the 2017 BiTS Workshop Archive index page<\/a><\/p>\n","protected":false},"excerpt":{"rendered":"

“Process Improvements to Increase Burn-In Yield and Quality” Jeanette Linn Texas Instruments Rich Karr Texas Instruments  Presentation Download “Device Characterization Over Temperature at the Board Level” Barry Johnson inTEST Thermal Solutions  Presentation Download “Qualifying A Process For Higher Burn-In Voltage Application” Krishna Mohan Chavali Globalfoundries US Inc  Presentation Download “Coming Challenges and Opportunities for MEMS Testing Supply Chain” Wendy Chen … <\/p>\n

Read More<\/a><\/div>\n","protected":false},"author":548,"featured_media":0,"comment_status":"closed","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"footnotes":""},"categories":[14],"tags":[],"class_list":["post-1949","post","type-post","status-publish","format-standard","hentry","category-bits2017","no-post-thumbnail"],"_links":{"self":[{"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/posts\/1949","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/users\/548"}],"replies":[{"embeddable":true,"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/comments?post=1949"}],"version-history":[{"count":7,"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/posts\/1949\/revisions"}],"predecessor-version":[{"id":2318,"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/posts\/1949\/revisions\/2318"}],"wp:attachment":[{"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/media?parent=1949"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/categories?post=1949"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/tags?post=1949"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}