
{"id":1942,"date":"2017-03-06T16:30:32","date_gmt":"2017-03-07T00:30:32","guid":{"rendered":"https:\/\/www.testconx.org\/premium\/?p=1942"},"modified":"2023-05-15T09:59:07","modified_gmt":"2023-05-15T16:59:07","slug":"bits-2017-session-3","status":"publish","type":"post","link":"https:\/\/www.testconx.org\/premium\/2017\/bits-2017-session-3\/","title":{"rendered":"BiTS 2017 Session 3"},"content":{"rendered":"<div class=\"presentation\" id=\"s3p1\">\"Augmenting form factor designs with validation and debug capability\"<\/div>\n<p><\/p>\n<p>John Kelbert<br \/>\nIntel Corporation<\/p>\n<p><a href=\"\/premium\/welcome\/\"><img loading=\"lazy\" decoding=\"async\" class=\"alignleft size-full wp-image-129\" title=\"Click here to subscribe to PREMIUM content\" alt=\"\" src=\"\/premium\/wp-content\/uploads\/premium-video-non-subscriber.png\" width=\"480\" height=\"270\" srcset=\"https:\/\/www.testconx.org\/premium\/wp-content\/uploads\/premium-video-non-subscriber.png 480w, https:\/\/www.testconx.org\/premium\/wp-content\/uploads\/premium-video-non-subscriber-300x168.png 300w\" sizes=\"auto, (max-width: 480px) 100vw, 480px\" \/><\/a><\/p>\n<div style=\"clear: both;\"><\/div>\n<p><a href=\"\/premium\/wp-content\/uploads\/2017\/BiTS2017s3p1Kelbert_4347.pdf\" target=\"_blank\"><img loading=\"lazy\" decoding=\"async\" class=\"size-full wp-image-70\" alt=\"PDF-Icon 150x139\" src=\"\/premium\/wp-content\/uploads\/PDF-Icon-150x139.png\" width=\"75\" height=\"70\" \/><\/a>&nbsp;<a href=\"\/premium\/wp-content\/uploads\/2017\/BiTS2017s3p1Kelbert_4347.pdf\" target=\"_blank\" \/>Presentation Download<\/a><\/p>\n<div class=\"presentation\" id=\"s3p2\">\"New Possiblity with Coax Via Risers\"<\/div>\n<p>\nMatthew Priolo<br \/>\nAdrian Rodriquez<br \/>\nChristopher Kinney<br \/>\nAdewale Oladeinde<br \/>\nIntel Corporation<\/p>\n<p><a href=\"\/premium\/welcome\/\"><img loading=\"lazy\" decoding=\"async\" class=\"alignleft size-full wp-image-129\" title=\"Click here to subscribe to PREMIUM content\" alt=\"\" src=\"\/premium\/wp-content\/uploads\/premium-video-non-subscriber.png\" width=\"480\" height=\"270\" srcset=\"https:\/\/www.testconx.org\/premium\/wp-content\/uploads\/premium-video-non-subscriber.png 480w, https:\/\/www.testconx.org\/premium\/wp-content\/uploads\/premium-video-non-subscriber-300x168.png 300w\" sizes=\"auto, (max-width: 480px) 100vw, 480px\" \/><\/a><\/p>\n<div style=\"clear: both;\"><\/div>\n<p><a href=\"\/premium\/wp-content\/uploads\/2017\/BiTS2017s3p2Priolo_9755.pdf\" target=\"_blank\"><img loading=\"lazy\" decoding=\"async\" class=\"size-full wp-image-70\" alt=\"PDF-Icon 150x139\" src=\"\/premium\/wp-content\/uploads\/PDF-Icon-150x139.png\" width=\"75\" height=\"70\" \/><\/a>&nbsp;<a href=\"\/premium\/wp-content\/uploads\/2017\/BiTS2017s3p2Priolo_9755.pdf\" target=\"_blank\" \/>Presentation Download<\/a><\/p>\n<div class=\"presentation\" id=\"s3p3\">\"Processes for Validating and Maintaining Electrical DUT Interfaces\"<\/div>\n<p><\/p>\n<p>Martin Gao<br \/>\nTexas Instruments<\/p>\n<p>Carolina Lock<br \/>\nTexas Instruments<\/p>\n<p><a href=\"\/premium\/welcome\/\"><img loading=\"lazy\" decoding=\"async\" class=\"alignleft size-full wp-image-129\" title=\"Click here to subscribe to PREMIUM content\" alt=\"\" src=\"\/premium\/wp-content\/uploads\/premium-video-non-subscriber.png\" width=\"480\" height=\"270\" srcset=\"https:\/\/www.testconx.org\/premium\/wp-content\/uploads\/premium-video-non-subscriber.png 480w, https:\/\/www.testconx.org\/premium\/wp-content\/uploads\/premium-video-non-subscriber-300x168.png 300w\" sizes=\"auto, (max-width: 480px) 100vw, 480px\" \/><\/a><\/p>\n<div style=\"clear: both;\"><\/div>\n<p><a href=\"\/premium\/wp-content\/uploads\/2017\/BiTS2017s3p3Gao_4367.pdf\" target=\"_blank\"><img loading=\"lazy\" decoding=\"async\" class=\"size-full wp-image-70\" alt=\"PDF-Icon 150x139\" src=\"\/premium\/wp-content\/uploads\/PDF-Icon-150x139.png\" width=\"75\" height=\"70\" \/><\/a>&nbsp;<a href=\"\/premium\/wp-content\/uploads\/2017\/BiTS2017s3p3Gao_4367.pdf\" target=\"_blank\" \/>Presentation Download<\/a><\/p>\n<p>&nbsp;<\/br><br \/>\nReturn to the 2017 BiTS Workshop Archive <a title=\"Return to 2017 Index\" href=\"\/premium\/bits-workshop-2017-event-archive\">index page<\/a><\/p>\n","protected":false},"excerpt":{"rendered":"<p>&#8220;Augmenting form factor designs with validation and debug capability&#8221; John Kelbert Intel Corporation &nbsp;Presentation Download &#8220;New Possiblity with Coax Via Risers&#8221; Matthew Priolo Adrian Rodriquez Christopher Kinney Adewale Oladeinde Intel Corporation &nbsp;Presentation Download &#8220;Processes for Validating and Maintaining Electrical DUT Interfaces&#8221; Martin Gao Texas Instruments Carolina Lock Texas Instruments &nbsp;Presentation Download &nbsp; Return to the 2017 BiTS Workshop Archive index &#8230; <\/p>\n<div><a href=\"https:\/\/www.testconx.org\/premium\/2017\/bits-2017-session-3\/\" class=\"more-link\">Read More<\/a><\/div>\n","protected":false},"author":548,"featured_media":0,"comment_status":"closed","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"footnotes":""},"categories":[14],"tags":[],"class_list":["post-1942","post","type-post","status-publish","format-standard","hentry","category-bits2017","no-post-thumbnail"],"_links":{"self":[{"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/posts\/1942","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/users\/548"}],"replies":[{"embeddable":true,"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/comments?post=1942"}],"version-history":[{"count":7,"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/posts\/1942\/revisions"}],"predecessor-version":[{"id":2660,"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/posts\/1942\/revisions\/2660"}],"wp:attachment":[{"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/media?parent=1942"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/categories?post=1942"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/tags?post=1942"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}