
{"id":1940,"date":"2017-03-06T13:30:13","date_gmt":"2017-03-06T21:30:13","guid":{"rendered":"https:\/\/www.testconx.org\/premium\/?p=1940"},"modified":"2023-05-15T09:59:07","modified_gmt":"2023-05-15T16:59:07","slug":"bits-2017-session-2","status":"publish","type":"post","link":"https:\/\/www.testconx.org\/premium\/2017\/bits-2017-session-2\/","title":{"rendered":"BiTS 2017 Session 2"},"content":{"rendered":"<div class=\"presentation\" id=\"s2p1\">\"Coaxial Test Socket - Evolution & Optimization\"<\/div>\n<p><\/p>\n<p>Frank Zhou<br \/>\nSmiths Connectors<\/p>\n<p><a href=\"\/premium\/welcome\/\"><img loading=\"lazy\" decoding=\"async\" class=\"alignleft size-full wp-image-129\" title=\"Click here to subscribe to PREMIUM content\" alt=\"\" src=\"\/premium\/wp-content\/uploads\/premium-video-non-subscriber.png\" width=\"480\" height=\"270\" srcset=\"https:\/\/www.testconx.org\/premium\/wp-content\/uploads\/premium-video-non-subscriber.png 480w, https:\/\/www.testconx.org\/premium\/wp-content\/uploads\/premium-video-non-subscriber-300x168.png 300w\" sizes=\"auto, (max-width: 480px) 100vw, 480px\" \/><\/a><\/p>\n<div style=\"clear: both;\"><\/div>\n<p><a href=\"\/premium\/wp-content\/uploads\/2017\/BiTS2017s2p1Zhou_9619.pdf\" target=\"_blank\"><img loading=\"lazy\" decoding=\"async\" class=\"size-full wp-image-70\" alt=\"PDF-Icon 150x139\" src=\"\/premium\/wp-content\/uploads\/PDF-Icon-150x139.png\" width=\"75\" height=\"70\" \/><\/a>&nbsp;<a href=\"\/premium\/wp-content\/uploads\/2017\/BiTS2017s2p1Zhou_9619.pdf\" target=\"_blank\" \/>Presentation Download<\/a><\/p>\n<div class=\"presentation\" id=\"s2p2\">\"100G Testing Fixture Design and Verification\"<\/div>\n<p><\/p>\n<p>Jackie Luo<br \/>\nShanghai Zenfocus Semi-Tech<\/p>\n<p><a href=\"\/premium\/welcome\/\"><img loading=\"lazy\" decoding=\"async\" class=\"alignleft size-full wp-image-129\" title=\"Click here to subscribe to PREMIUM content\" alt=\"\" src=\"\/premium\/wp-content\/uploads\/premium-video-non-subscriber.png\" width=\"480\" height=\"270\" srcset=\"https:\/\/www.testconx.org\/premium\/wp-content\/uploads\/premium-video-non-subscriber.png 480w, https:\/\/www.testconx.org\/premium\/wp-content\/uploads\/premium-video-non-subscriber-300x168.png 300w\" sizes=\"auto, (max-width: 480px) 100vw, 480px\" \/><\/a><\/p>\n<div style=\"clear: both;\"><\/div>\n<p><a href=\"\/premium\/wp-content\/uploads\/2017\/BiTS2017s2p2Luo_5103.pdf\" target=\"_blank\"><img loading=\"lazy\" decoding=\"async\" class=\"size-full wp-image-70\" alt=\"PDF-Icon 150x139\" src=\"\/premium\/wp-content\/uploads\/PDF-Icon-150x139.png\" width=\"75\" height=\"70\" \/><\/a>&nbsp;<a href=\"\/premium\/wp-content\/uploads\/2017\/BiTS2017s2p2Luo_5103.pdf\" target=\"_blank\" \/>Presentation Download<\/a><\/p>\n<div class=\"presentation\" id=\"s2p3\">\"Inductance Rise Due To Plating\"<\/div>\n<p><\/p>\n<p>Gert Hohenwarter<br \/>\nGateWave Northern, Inc.<\/p>\n<p><a href=\"\/premium\/welcome\/\"><img loading=\"lazy\" decoding=\"async\" class=\"alignleft size-full wp-image-129\" title=\"Click here to subscribe to PREMIUM content\" alt=\"\" src=\"\/premium\/wp-content\/uploads\/premium-video-non-subscriber.png\" width=\"480\" height=\"270\" srcset=\"https:\/\/www.testconx.org\/premium\/wp-content\/uploads\/premium-video-non-subscriber.png 480w, https:\/\/www.testconx.org\/premium\/wp-content\/uploads\/premium-video-non-subscriber-300x168.png 300w\" sizes=\"auto, (max-width: 480px) 100vw, 480px\" \/><\/a><\/p>\n<div style=\"clear: both;\"><\/div>\n<p><a href=\"\/premium\/wp-content\/uploads\/2017\/BiTS2017s2p3Hohenwarter_2943.pdf\" target=\"_blank\"><img loading=\"lazy\" decoding=\"async\" class=\"size-full wp-image-70\" alt=\"PDF-Icon 150x139\" src=\"\/premium\/wp-content\/uploads\/PDF-Icon-150x139.png\" width=\"75\" height=\"70\" \/><\/a>&nbsp;<a href=\"\/premium\/wp-content\/uploads\/2017\/BiTS2017s2p3Hohenwarter_2943.pdf\" target=\"_blank\" \/>Presentation Download<\/a><\/p>\n<div class=\"presentation\" id=\"s2p4\">\"Spring probe current-carrying capacity (continuous vs pulse) analysis and improvement\"<\/div>\n<p><\/p>\n<p>Yuanjun Shi<br \/>\nTwinSolution Technology Ltd<\/p>\n<p><a href=\"\/premium\/welcome\/\"><img loading=\"lazy\" decoding=\"async\" class=\"alignleft size-full wp-image-129\" title=\"Click here to subscribe to PREMIUM content\" alt=\"\" src=\"\/premium\/wp-content\/uploads\/premium-video-non-subscriber.png\" width=\"480\" height=\"270\" srcset=\"https:\/\/www.testconx.org\/premium\/wp-content\/uploads\/premium-video-non-subscriber.png 480w, https:\/\/www.testconx.org\/premium\/wp-content\/uploads\/premium-video-non-subscriber-300x168.png 300w\" sizes=\"auto, (max-width: 480px) 100vw, 480px\" \/><\/a><\/p>\n<div style=\"clear: both;\"><\/div>\n<p><a href=\"\/premium\/wp-content\/uploads\/2017\/BiTS2017s2p4Shi_7118.pdf\" target=\"_blank\"><img loading=\"lazy\" decoding=\"async\" class=\"size-full wp-image-70\" alt=\"PDF-Icon 150x139\" src=\"\/premium\/wp-content\/uploads\/PDF-Icon-150x139.png\" width=\"75\" height=\"70\" \/><\/a>&nbsp;<a href=\"\/premium\/wp-content\/uploads\/2017\/BiTS2017s2p4Shi_7118.pdf\" target=\"_blank\" \/>Presentation Download<\/a>  <\/p>\n<p>&nbsp;<\/br><br \/>\nReturn to the 2017 BiTS Workshop Archive <a title=\"Return to 2017 Index\" href=\"\/premium\/bits-workshop-2017-event-archive\">index page<\/a><\/p>\n","protected":false},"excerpt":{"rendered":"<p>&#8220;Coaxial Test Socket &#8211; Evolution &#038; Optimization&#8221; Frank Zhou Smiths Connectors &nbsp;Presentation Download &#8220;100G Testing Fixture Design and Verification&#8221; Jackie Luo Shanghai Zenfocus Semi-Tech &nbsp;Presentation Download &#8220;Inductance Rise Due To Plating&#8221; Gert Hohenwarter GateWave Northern, Inc. &nbsp;Presentation Download &#8220;Spring probe current-carrying capacity (continuous vs pulse) analysis and improvement&#8221; Yuanjun Shi TwinSolution Technology Ltd &nbsp;Presentation Download &nbsp; Return to the 2017 &#8230; <\/p>\n<div><a href=\"https:\/\/www.testconx.org\/premium\/2017\/bits-2017-session-2\/\" class=\"more-link\">Read More<\/a><\/div>\n","protected":false},"author":548,"featured_media":0,"comment_status":"closed","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"footnotes":""},"categories":[14],"tags":[],"class_list":["post-1940","post","type-post","status-publish","format-standard","hentry","category-bits2017","no-post-thumbnail"],"_links":{"self":[{"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/posts\/1940","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/users\/548"}],"replies":[{"embeddable":true,"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/comments?post=1940"}],"version-history":[{"count":10,"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/posts\/1940\/revisions"}],"predecessor-version":[{"id":2661,"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/posts\/1940\/revisions\/2661"}],"wp:attachment":[{"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/media?parent=1940"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/categories?post=1940"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/tags?post=1940"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}