{"id":1784,"date":"2016-09-13T09:21:58","date_gmt":"2016-09-13T16:21:58","guid":{"rendered":"https:\/\/www.testconx.org\/premium\/?p=1784"},"modified":"2023-05-15T09:59:07","modified_gmt":"2023-05-15T16:59:07","slug":"china-bits-2016-keynote-and-opening","status":"publish","type":"post","link":"https:\/\/www.testconx.org\/premium\/2016\/china-bits-2016-keynote-and-opening\/","title":{"rendered":"BiTS China 2016 Keynote and Opening"},"content":{"rendered":"<div class=\"presentation\" id=\"s0p1\">Opening Remarks<\/div>\n<p><\/p>\n<p><strong>Ira Feldman<\/strong>, BiTS General Chair<br \/>\n<strong>Steven Zheng<\/strong>, BiTS China Chair<\/p>\n<p><a href=\"\/premium\/welcome\/\"><img loading=\"lazy\" decoding=\"async\" class=\"alignleft size-full wp-image-129\" title=\"Click here to subscribe to PREMIUM content\" alt=\"\" src=\"\/premium\/wp-content\/uploads\/premium-video-non-subscriber.png\" width=\"480\" height=\"270\" srcset=\"https:\/\/www.testconx.org\/premium\/wp-content\/uploads\/premium-video-non-subscriber.png 480w, https:\/\/www.testconx.org\/premium\/wp-content\/uploads\/premium-video-non-subscriber-300x168.png 300w\" sizes=\"auto, (max-width: 480px) 100vw, 480px\" \/><\/a><\/p>\n<div style=\"clear: both;\"><\/div>\n<p><a href=\"\/premium\/wp-content\/uploads\/2016china\/BiTS-China2016s0p1OpeningRemarks_1608.pdf\" target=\"_blank\"><img loading=\"lazy\" decoding=\"async\" class=\"size-full wp-image-70\" alt=\"PDF-Icon 150x139\" src=\"\/premium\/wp-content\/uploads\/PDF-Icon-150x139.png\" width=\"75\" height=\"70\" \/><\/a>&nbsp;<a href=\"\/premium\/wp-content\/uploads\/2016china\/BiTS-China2016s0p1OpeningRemarks_1608.pdf\" target=\"_blank\" \/>Presentation Download<\/a>  <\/p>\n<div class=\"presentation\" id=\"s0p2\">\"Evolutions in Packaging Technologies for IoT \u2013 Assembly <br \/> and Testing\"<\/p>\n<\/div>\n<p>\n<strong>\"\u7269\u8054\u7f51\u5c01\u88c5\u9769\u547d- \u7ec4\u88c5\u4e0e\u6d4b\u8bd5\"<\/strong><br \/>\n<strong>Yifan Guo \u90ed\u4e00\u51e1<\/strong><\/p>\n<p>ASE Assembly and Test<\/p>\n<p><a href=\"\/premium\/welcome\/\"><img loading=\"lazy\" decoding=\"async\" class=\"alignleft size-full wp-image-129\" title=\"Click here to subscribe to PREMIUM content\" alt=\"\" src=\"\/premium\/wp-content\/uploads\/premium-video-non-subscriber.png\" width=\"480\" height=\"270\" srcset=\"https:\/\/www.testconx.org\/premium\/wp-content\/uploads\/premium-video-non-subscriber.png 480w, https:\/\/www.testconx.org\/premium\/wp-content\/uploads\/premium-video-non-subscriber-300x168.png 300w\" sizes=\"auto, (max-width: 480px) 100vw, 480px\" \/><\/a><\/p>\n<div style=\"clear: both;\"><\/div>\n<p><a href=\"\/premium\/wp-content\/uploads\/2016china\/BiTS-China2016s0p2Keynote-Guo_3384.pdf\" target=\"_blank\"><img loading=\"lazy\" decoding=\"async\" class=\"size-full wp-image-70\" alt=\"PDF-Icon 150x139\" src=\"\/premium\/wp-content\/uploads\/PDF-Icon-150x139.png\" width=\"75\" height=\"70\" \/><\/a>&nbsp;<a href=\"\/premium\/wp-content\/uploads\/2016china\/BiTS-China2016s0p2Keynote-Guo_3384.pdf\" target=\"_blank\" \/>Presentation Download<\/a>  <\/p>\n<p>&nbsp;<\/br><br \/>\nReturn to the 2016 BiTS China Workshop Archive <a title=\"Return to 2016 BiTS China Index\" href=\"https:\/\/www.testconx.org\/premium\/bits-china-2016\/\">index page<\/a><\/p>\n","protected":false},"excerpt":{"rendered":"<p>Opening Remarks Ira Feldman, BiTS General Chair Steven Zheng, BiTS China Chair &nbsp;Presentation Download &#8220;Evolutions in Packaging Technologies for IoT \u2013 Assembly and Testing&#8221; &#8220;\u7269\u8054\u7f51\u5c01\u88c5\u9769\u547d- \u7ec4\u88c5\u4e0e\u6d4b\u8bd5&#8221; Yifan Guo \u90ed\u4e00\u51e1 ASE Assembly and Test &nbsp;Presentation Download &nbsp; Return to the 2016 BiTS China Workshop Archive index page<\/p>\n","protected":false},"author":548,"featured_media":0,"comment_status":"closed","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"footnotes":""},"categories":[13],"tags":[],"class_list":["post-1784","post","type-post","status-publish","format-standard","hentry","category-bits-china-2016","no-post-thumbnail"],"_links":{"self":[{"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/posts\/1784","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/users\/548"}],"replies":[{"embeddable":true,"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/comments?post=1784"}],"version-history":[{"count":18,"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/posts\/1784\/revisions"}],"predecessor-version":[{"id":2668,"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/posts\/1784\/revisions\/2668"}],"wp:attachment":[{"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/media?parent=1784"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/categories?post=1784"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/tags?post=1784"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}