{"id":1780,"date":"2016-09-13T10:20:24","date_gmt":"2016-09-13T17:20:24","guid":{"rendered":"https:\/\/www.testconx.org\/premium\/?p=1780"},"modified":"2023-05-15T09:59:07","modified_gmt":"2023-05-15T16:59:07","slug":"china-bits-2016-session-1","status":"publish","type":"post","link":"https:\/\/www.testconx.org\/premium\/2016\/china-bits-2016-session-1\/","title":{"rendered":"BiTS China 2016 Session 1"},"content":{"rendered":"
\"Implementation Challenges of an ATE Test Cell for At-Speed Production Test of 32 Gbps Applications\"\n<\/div>\n

\"32 Gbps\u901f\u5ea6\u5e94\u7528\u5728\u81ea\u52a8\u6d4b\u8bd5\u5355\u5143\u91cf\u4ea7\u5b9e\u65bd\u4e2d\u7684\u6311\u6218\"<\/strong>
\nJose Moreira
\nAdvantest
\nHubert Werkmann
\nAdvantest
\nDaniel Lam
\nAdvantest
\nBernhard Roth
\nAdvantest<\/p>\n

\"\"<\/a><\/p>\n

<\/div>\n

\"PDF-Icon<\/a> Presentation Download<\/a> <\/p>\n

\"Addressing Challenges in High Temperature Burn-In\"\n<\/div>\n

\"\u9ad8\u6e29\u8001\u5316\u6d4b\u8bd5\u6311\u6218\u7684\u8ba8\u8bba\"<\/strong><\/p>\n

Paolo Rodriguez
\nAnalog Devices Philippines<\/p>\n

\"\"<\/a><\/p>\n

<\/div>\n

\"PDF-Icon<\/a> Presentation Download<\/a><\/p>\n

\"Derating Transient Voltage Suppressor Diodes for Burn-In Applications\"\n<\/div>\n

\"\u8001\u5316\u6d4b\u8bd5\u4e2d\u77ac\u6001\u7535\u538b\u6291\u5236\u5668\u7684\u964d\u989d\u8bbe\u8ba1\"<\/strong>
\nGil Conanan
\nAnalog Devices Philippines
\nRolando Reyes
\nAnalog Devices Philippines<\/p>\n

\"\"<\/a><\/p>\n

<\/div>\n

\"PDF-Icon<\/a> Presentation Download<\/a><\/p>\n

\"An Ignorable Testing Technology for High Speed\/Frequency Device Testing\"\n<\/div>\n

\"\u4e00\u4e2a\u4e0d\u5bb9\u5ffd\u89c6\u7684\u9ad8\u901f\u82af\u7247\u6d4b\u8bd5\u65b9\u6cd5\"<\/strong>
\nPang Cheng Chiu
\nJthink Technology
\nSung Mao Wu
\nNational University of Kaohsiung
\nLung Shu Huang
\nJthink Technology
\nKuan-I Cheng
\nNational University of Kaohsiung
\nChih-Cheng Chuang
\nNational University of Kaohsiung<\/p>\n

\"\"<\/a><\/p>\n

<\/div>\n

\"PDF-Icon<\/a> Presentation Download<\/a><\/p>\n

 <\/br>
\nReturn to the 2016 BiTS China Workshop Archive index page<\/a><\/p>\n","protected":false},"excerpt":{"rendered":"

“Implementation Challenges of an ATE Test Cell for At-Speed Production Test of 32 Gbps Applications” “32 Gbps\u901f\u5ea6\u5e94\u7528\u5728\u81ea\u52a8\u6d4b\u8bd5\u5355\u5143\u91cf\u4ea7\u5b9e\u65bd\u4e2d\u7684\u6311\u6218” Jose Moreira Advantest Hubert Werkmann Advantest Daniel Lam Advantest Bernhard Roth Advantest  Presentation Download “Addressing Challenges in High Temperature Burn-In” “\u9ad8\u6e29\u8001\u5316\u6d4b\u8bd5\u6311\u6218\u7684\u8ba8\u8bba” Paolo Rodriguez Analog Devices Philippines  Presentation Download “Derating Transient Voltage Suppressor Diodes for Burn-In Applications” “\u8001\u5316\u6d4b\u8bd5\u4e2d\u77ac\u6001\u7535\u538b\u6291\u5236\u5668\u7684\u964d\u989d\u8bbe\u8ba1” Gil Conanan Analog Devices Philippines Rolando … <\/p>\n

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