{"id":1612,"date":"2016-04-04T17:39:50","date_gmt":"2016-04-05T00:39:50","guid":{"rendered":"https:\/\/www.testconx.org\/premium\/?p=1612"},"modified":"2023-05-15T09:59:26","modified_gmt":"2023-05-15T16:59:26","slug":"bits-2016-distinguished","status":"publish","type":"post","link":"https:\/\/www.testconx.org\/premium\/2016\/bits-2016-distinguished\/","title":{"rendered":"BiTS 2016 Distinguished"},"content":{"rendered":"<div class=\"presentation\" id=\"s0p2\">\"Recovery from the Downturn; Technologies That Will Drive Semiconductor Business for the Coming Years\"<\/div>\n<p><\/p>\n<p><strong>Risto Puhakka<\/strong><br \/>\n VLSIresearch<\/p>\n<p><a href=\"\/premium\/welcome\/\"><img loading=\"lazy\" decoding=\"async\" class=\"alignleft size-full wp-image-129\" title=\"Click here to subscribe to PREMIUM content\" alt=\"\" src=\"\/premium\/wp-content\/uploads\/premium-video-non-subscriber.png\" width=\"480\" height=\"270\" srcset=\"https:\/\/www.testconx.org\/premium\/wp-content\/uploads\/premium-video-non-subscriber.png 480w, https:\/\/www.testconx.org\/premium\/wp-content\/uploads\/premium-video-non-subscriber-300x168.png 300w\" sizes=\"auto, (max-width: 480px) 100vw, 480px\" \/><\/a><\/p>\n<div style=\"clear: both;\"><\/div>\n<p><a href=\"\/premium\/wp-content\/uploads\/2016\/BiTS2016s0p1Distinguished-Phuakka_7801.pdf\" target=\"_blank\"><img loading=\"lazy\" decoding=\"async\" class=\"size-full wp-image-70\" alt=\"PDF-Icon 150x139\" src=\"\/premium\/wp-content\/uploads\/PDF-Icon-150x139.png\" width=\"75\" height=\"70\" \/><\/a>&nbsp;<a href=\"\/premium\/wp-content\/uploads\/2016\/BiTS2016s0p1Distinguished-Phuakka_7801.pdf\" target=\"_blank\" \/>Presentation Download<\/a>    <\/p>\n<p>&nbsp;<\/br><br \/>\nReturn to the 2016 BiTS Workshop Archive <a title=\"Return to 2016 Index\" href=\"\/premium\/bits-workshop-2016-event-archive\">index page<\/a><\/p>\n","protected":false},"excerpt":{"rendered":"<p>&#8220;Recovery from the Downturn; Technologies That Will Drive Semiconductor Business for the Coming Years&#8221; Risto Puhakka VLSIresearch &nbsp;Presentation Download &nbsp; Return to the 2016 BiTS Workshop Archive index page<\/p>\n","protected":false},"author":548,"featured_media":0,"comment_status":"closed","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"footnotes":""},"categories":[11],"tags":[],"class_list":["post-1612","post","type-post","status-publish","format-standard","hentry","category-bits2016","no-post-thumbnail"],"_links":{"self":[{"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/posts\/1612","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/users\/548"}],"replies":[{"embeddable":true,"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/comments?post=1612"}],"version-history":[{"count":8,"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/posts\/1612\/revisions"}],"predecessor-version":[{"id":2671,"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/posts\/1612\/revisions\/2671"}],"wp:attachment":[{"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/media?parent=1612"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/categories?post=1612"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/tags?post=1612"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}