{"id":1533,"date":"2016-03-09T10:00:42","date_gmt":"2016-03-09T18:00:42","guid":{"rendered":"https:\/\/www.testconx.org\/premium\/?p=1533"},"modified":"2023-05-15T09:59:26","modified_gmt":"2023-05-15T16:59:26","slug":"bits-2016-session-8","status":"publish","type":"post","link":"https:\/\/www.testconx.org\/premium\/2016\/bits-2016-session-8\/","title":{"rendered":"BiTS 2016 Session 8"},"content":{"rendered":"
\"Modeling Socket Thermal Performance Inside a Burn-In Chamber\"\n<\/div>\n

Jason Cullen
\nPlastronics
\nRob Caldwell
\nDelta V Instruments<\/p>\n

\"\"<\/a><\/p>\n

<\/div>\n

\"PDF-Icon<\/a> Presentation Download<\/a> <\/p>\n

\"Established the first WLCSP Testing at Tri-temp for RF and Non-RF Products\"<\/div>\n

Edwin Valderama
\nJin Sheng Tan
\nIntel Technologies<\/p>\n

\"\"<\/a><\/p>\n

<\/div>\n

\"PDF-Icon<\/a> Presentation Download<\/a> <\/p>\n

\"A Silicon Photonics Wafer Probing Test Cell\"<\/p>\n<\/div>\n

Roberto Aranzulla, Daniele Sala, Roberto Barbon - ST Microelectronics
\nGiuseppe Astone, Maurizio Rigamonti, Massimo Galli - ST Microelectronics
\nJean Luc Jeanneau, Dario Adorni, Paul Mooney - Tokyo Electron
\nHubert Werkmann, Fabio Pizza - Advantest Europe GmbH
\nJose Moreira, Zhan Zhang - Advantest<\/p>\n

\"\"<\/a><\/p>\n

<\/div>\n

\"PDF-Icon<\/a> Presentation Download<\/a> <\/p>\n

 <\/br>
\nReturn to the 2016 BiTS Workshop Archive index page<\/a><\/p>\n","protected":false},"excerpt":{"rendered":"

“Modeling Socket Thermal Performance Inside a Burn-In Chamber” Jason Cullen Plastronics Rob Caldwell Delta V Instruments  Presentation Download “Established the first WLCSP Testing at Tri-temp for RF and Non-RF Products” Edwin Valderama Jin Sheng Tan Intel Technologies  Presentation Download “A Silicon Photonics Wafer Probing Test Cell” Roberto Aranzulla, Daniele Sala, Roberto Barbon – ST Microelectronics Giuseppe Astone, Maurizio Rigamonti, Massimo … <\/p>\n

Read More<\/a><\/div>\n","protected":false},"author":548,"featured_media":0,"comment_status":"closed","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"footnotes":""},"categories":[11],"tags":[],"class_list":["post-1533","post","type-post","status-publish","format-standard","hentry","category-bits2016","no-post-thumbnail"],"_links":{"self":[{"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/posts\/1533","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/users\/548"}],"replies":[{"embeddable":true,"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/comments?post=1533"}],"version-history":[{"count":8,"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/posts\/1533\/revisions"}],"predecessor-version":[{"id":2673,"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/posts\/1533\/revisions\/2673"}],"wp:attachment":[{"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/media?parent=1533"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/categories?post=1533"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/tags?post=1533"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}