{"id":1525,"date":"2016-03-08T10:00:42","date_gmt":"2016-03-08T18:00:42","guid":{"rendered":"https:\/\/www.testconx.org\/premium\/?p=1525"},"modified":"2023-05-15T09:59:26","modified_gmt":"2023-05-15T16:59:26","slug":"bits-2016-session-5","status":"publish","type":"post","link":"https:\/\/www.testconx.org\/premium\/2016\/bits-2016-session-5\/","title":{"rendered":"BiTS 2016 Session 5"},"content":{"rendered":"
\"LPDDR4 Signal & Power Performance Optimization By Hardware\"<\/div>\n

\"\u901a\u8fc7\u6d4b\u8bd5\u786c\u4ef6\u7684\u4f18\u5316\u6765\u63d0\u5347LPDDR4\u4fe1\u53f7\u548c\u7535\u6e90\u7684\u6027\u80fd\"<\/strong>
\nYuanjun Shi
\nTwinsolution Technology
\nXiao Yao
\nHiSilicon Technologies Co<\/p>\n

\"\"<\/a><\/p>\n

<\/div>\n

\"PDF-Icon<\/a> Presentation Download<\/a> <\/p>\n

\"Reliability Characterization of Unpackaged (bare) die for Silicon Photonics module\"<\/p>\n<\/div>\n

Sujata Paul, Andrew Fong, Samir Alqadhy, Huy Nguyen, Zoe Conroy
\nCisco
\nTom Elliot, Jag Jassal
\nEvans Analytical Group<\/p>\n

\"\"<\/a><\/p>\n

<\/div>\n

\"PDF-Icon<\/a> Presentation Download<\/a> <\/p>\n

\"Advanced High Energy CO2 Spray Cleaning Technology for Burn-In Test Substrate Cleaning Applications\"<\/div>\n

Nelson Sorbo
\nCool Clean Technologies<\/p>\n

\"\"<\/a><\/p>\n

<\/div>\n

\"PDF-Icon<\/a> Presentation Download<\/a> <\/p>\n

\"Texas Instruments Final Test Contactor Qualification Process and Low Profile Contactor Solution\" <\/p>\n<\/div>\n

James Tong
\nHisashi Ata
\nTexas Instruments<\/p>\n

\"\"<\/a><\/p>\n

<\/div>\n

\"PDF-Icon<\/a> Presentation Download<\/a> <\/p>\n

 <\/br><\/p>\n

Return to the 2016 BiTS Workshop Archive index page<\/a><\/h2>\n","protected":false},"excerpt":{"rendered":"

“LPDDR4 Signal & Power Performance Optimization By Hardware” “\u901a\u8fc7\u6d4b\u8bd5\u786c\u4ef6\u7684\u4f18\u5316\u6765\u63d0\u5347LPDDR4\u4fe1\u53f7\u548c\u7535\u6e90\u7684\u6027\u80fd” Yuanjun Shi Twinsolution Technology Xiao Yao HiSilicon Technologies Co  Presentation Download “Reliability Characterization of Unpackaged (bare) die for Silicon Photonics module” Sujata Paul, Andrew Fong, Samir Alqadhy, Huy Nguyen, Zoe Conroy Cisco Tom Elliot, Jag Jassal Evans Analytical Group  Presentation Download “Advanced High Energy CO2 Spray Cleaning Technology for Burn-In Test … <\/p>\n

Read More<\/a><\/div>\n","protected":false},"author":548,"featured_media":0,"comment_status":"closed","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"footnotes":""},"categories":[11],"tags":[],"class_list":["post-1525","post","type-post","status-publish","format-standard","hentry","category-bits2016","no-post-thumbnail"],"_links":{"self":[{"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/posts\/1525","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/users\/548"}],"replies":[{"embeddable":true,"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/comments?post=1525"}],"version-history":[{"count":6,"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/posts\/1525\/revisions"}],"predecessor-version":[{"id":2337,"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/posts\/1525\/revisions\/2337"}],"wp:attachment":[{"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/media?parent=1525"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/categories?post=1525"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/tags?post=1525"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}