
{"id":1523,"date":"2016-03-08T09:00:59","date_gmt":"2016-03-08T17:00:59","guid":{"rendered":"https:\/\/www.testconx.org\/premium\/?p=1523"},"modified":"2023-05-15T09:59:26","modified_gmt":"2023-05-15T16:59:26","slug":"bits-2016-session-4","status":"publish","type":"post","link":"https:\/\/www.testconx.org\/premium\/2016\/bits-2016-session-4\/","title":{"rendered":"BiTS 2016 Session 4"},"content":{"rendered":"<div class=\"presentation\" id=\"s3p1\">\"High Speed BGA Sockets from a System Perspective\"<\/div>\n<p>Don Thompson<br \/>\nR&D Altanova<\/p>\n<p>  <a href=\"\/premium\/welcome\/\"><img loading=\"lazy\" decoding=\"async\" class=\"alignleft size-full wp-image-129\" title=\"Click here to subscribe to PREMIUM content\" alt=\"\" src=\"\/premium\/wp-content\/uploads\/premium-video-non-subscriber.png\" width=\"480\" height=\"270\" srcset=\"https:\/\/www.testconx.org\/premium\/wp-content\/uploads\/premium-video-non-subscriber.png 480w, https:\/\/www.testconx.org\/premium\/wp-content\/uploads\/premium-video-non-subscriber-300x168.png 300w\" sizes=\"auto, (max-width: 480px) 100vw, 480px\" \/><\/a><\/p>\n<div style=\"clear: both;\"><\/div>\n<p><a href=\"\/premium\/wp-content\/uploads\/2016\/BiTS2016s4p1Thompson_1797.pdf\" target=\"_blank\"><img loading=\"lazy\" decoding=\"async\" class=\"size-full wp-image-70\" alt=\"PDF-Icon 150x139\" src=\"\/premium\/wp-content\/uploads\/PDF-Icon-150x139.png\" width=\"75\" height=\"70\" \/><\/a>&nbsp;<a href=\"\/premium\/wp-content\/uploads\/2016\/BiTS2016s4p1Thompson_1797.pdf\" target=\"_blank\" \/>Presentation Download<\/a>  <\/p>\n<div class=\"presentation\" id=\"s4p2\">\"A Solution of Test, Inspection and Evaluation for Blind Signal Waveform on a Board\"<\/div>\n<p>Tatsumi\tWatabe<br \/>\nMakoto\tKawamura<br \/>\nHiroyuki Yamakoshi<br \/>\nS.E.R. Corporation<\/p>\n<p>  <a href=\"\/premium\/welcome\/\"><img loading=\"lazy\" decoding=\"async\" class=\"alignleft size-full wp-image-129\" title=\"Click here to subscribe to PREMIUM content\" alt=\"\" src=\"\/premium\/wp-content\/uploads\/premium-video-non-subscriber.png\" width=\"480\" height=\"270\" srcset=\"https:\/\/www.testconx.org\/premium\/wp-content\/uploads\/premium-video-non-subscriber.png 480w, https:\/\/www.testconx.org\/premium\/wp-content\/uploads\/premium-video-non-subscriber-300x168.png 300w\" sizes=\"auto, (max-width: 480px) 100vw, 480px\" \/><\/a><\/p>\n<div style=\"clear: both;\"><\/div>\n<p><a href=\"\/premium\/wp-content\/uploads\/2016\/BiTS2016s4p2Yamakoshi_8781.pdf\" target=\"_blank\"><img loading=\"lazy\" decoding=\"async\" class=\"size-full wp-image-70\" alt=\"PDF-Icon 150x139\" src=\"\/premium\/wp-content\/uploads\/PDF-Icon-150x139.png\" width=\"75\" height=\"70\" \/><\/a>&nbsp;<a href=\"\/premium\/wp-content\/uploads\/2016\/BiTS2016s4p2Yamakoshi_8781.pdf\" target=\"_blank\" \/>Presentation Download<\/a>  <\/p>\n<div class=\"presentation\" id=\"s4p3\">\"Device Packaging and How It Affects RF Performance\"<\/div>\n<p>Noureen Sajid, Jeff Sherry<br \/>\nJohnstech International<\/p>\n<p>  <a href=\"\/premium\/welcome\/\"><img loading=\"lazy\" decoding=\"async\" class=\"alignleft size-full wp-image-129\" title=\"Click here to subscribe to PREMIUM content\" alt=\"\" src=\"\/premium\/wp-content\/uploads\/premium-video-non-subscriber.png\" width=\"480\" height=\"270\" srcset=\"https:\/\/www.testconx.org\/premium\/wp-content\/uploads\/premium-video-non-subscriber.png 480w, https:\/\/www.testconx.org\/premium\/wp-content\/uploads\/premium-video-non-subscriber-300x168.png 300w\" sizes=\"auto, (max-width: 480px) 100vw, 480px\" \/><\/a><\/p>\n<div style=\"clear: both;\"><\/div>\n<p><a href=\"\/premium\/wp-content\/uploads\/2016\/BiTS2016s4p3Sajid_5533.pdf\" target=\"_blank\"><img loading=\"lazy\" decoding=\"async\" class=\"size-full wp-image-70\" alt=\"PDF-Icon 150x139\" src=\"\/premium\/wp-content\/uploads\/PDF-Icon-150x139.png\" width=\"75\" height=\"70\" \/><\/a>&nbsp;<a href=\"\/premium\/wp-content\/uploads\/2016\/BiTS2016s4p3Sajid_5533.pdf\" target=\"_blank\" \/>Presentation Download<\/a>  <\/p>\n<div class=\"presentation\" id=\"s4p4\">\"Automotive Radar Test\" <\/div>\n<p>Jason Mroczkowski<br \/>\nXcerra Corporation<\/p>\n<p>  <a href=\"\/premium\/welcome\/\"><img loading=\"lazy\" decoding=\"async\" class=\"alignleft size-full wp-image-129\" title=\"Click here to subscribe to PREMIUM content\" alt=\"\" src=\"\/premium\/wp-content\/uploads\/premium-video-non-subscriber.png\" width=\"480\" height=\"270\" srcset=\"https:\/\/www.testconx.org\/premium\/wp-content\/uploads\/premium-video-non-subscriber.png 480w, https:\/\/www.testconx.org\/premium\/wp-content\/uploads\/premium-video-non-subscriber-300x168.png 300w\" sizes=\"auto, (max-width: 480px) 100vw, 480px\" \/><\/a><\/p>\n<div style=\"clear: both;\"><\/div>\n<p><a href=\"\/premium\/wp-content\/uploads\/2016\/BiTS2016s4p4Mroczkowski_6445.pdf\" target=\"_blank\"><img loading=\"lazy\" decoding=\"async\" class=\"size-full wp-image-70\" alt=\"PDF-Icon 150x139\" src=\"\/premium\/wp-content\/uploads\/PDF-Icon-150x139.png\" width=\"75\" height=\"70\" \/><\/a>&nbsp;<a href=\"\/premium\/wp-content\/uploads\/2016\/BiTS2016s4p4Mroczkowski_6445.pdf\" target=\"_blank\" \/>Presentation Download<\/a>  <\/p>\n<p>&nbsp;<\/br><\/p>\n<h2>Return to the 2016 BiTS Workshop Archive <a title=\"Return to 2016 Index\" href=\"\/premium\/bits-workshop-2016-event-archive\">index page<\/a><\/h2>\n","protected":false},"excerpt":{"rendered":"<p>&#8220;High Speed BGA Sockets from a System Perspective&#8221; Don Thompson R&#038;D Altanova &nbsp;Presentation Download &#8220;A Solution of Test, Inspection and Evaluation for Blind Signal Waveform on a Board&#8221; Tatsumi Watabe Makoto Kawamura Hiroyuki Yamakoshi S.E.R. Corporation &nbsp;Presentation Download &#8220;Device Packaging and How It Affects RF Performance&#8221; Noureen Sajid, Jeff Sherry Johnstech International &nbsp;Presentation Download &#8220;Automotive Radar Test&#8221; Jason Mroczkowski Xcerra &#8230; <\/p>\n<div><a href=\"https:\/\/www.testconx.org\/premium\/2016\/bits-2016-session-4\/\" class=\"more-link\">Read More<\/a><\/div>\n","protected":false},"author":548,"featured_media":0,"comment_status":"closed","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"footnotes":""},"categories":[11],"tags":[],"class_list":["post-1523","post","type-post","status-publish","format-standard","hentry","category-bits2016","no-post-thumbnail"],"_links":{"self":[{"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/posts\/1523","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/users\/548"}],"replies":[{"embeddable":true,"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/comments?post=1523"}],"version-history":[{"count":6,"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/posts\/1523\/revisions"}],"predecessor-version":[{"id":2339,"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/posts\/1523\/revisions\/2339"}],"wp:attachment":[{"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/media?parent=1523"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/categories?post=1523"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/tags?post=1523"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}