{"id":1410,"date":"2015-10-21T14:13:04","date_gmt":"2015-10-21T21:13:04","guid":{"rendered":"https:\/\/www.testconx.org\/premium\/?p=1410"},"modified":"2023-05-15T09:59:26","modified_gmt":"2023-05-15T16:59:26","slug":"shanghai-session-1","status":"publish","type":"post","link":"https:\/\/www.testconx.org\/premium\/2015\/shanghai-session-1\/","title":{"rendered":"Shanghai Session 1"},"content":{"rendered":"
\"PCB Test Fixture and DUT Socket Challenges for 32 Gbps\/GBaud ATE Applications\"<\/div>\n

\"\u8d85\u9ad8\u901f\u4fe1\u53f7(32Gbps\/Gbaud)\u7684\u6d4b\u8bd5: \u7535\u8def\u677f\u4e0e\u6d4b\u8bd5\u57fa\u5ea7\u7684\u8bbe\u8ba1\u4e0e\u6311\u6218\"<\/strong>
\nJose Moreira
\nAdvantest<\/p>\n

Christian Borelli
\nSTMicroelectronics<\/p>\n

Fulvio Corneo
\nSTMicroelectronics<\/p>\n

\"\"<\/a><\/p>\n

<\/div>\n

\"PDF-Icon<\/a> Presentation Download<\/a><\/p>\n

\"Designing Sockets for Ludicrous Speed (80 GHz)\"<\/div>\n

\"\u9002\u7528\u4e8e\u98de\u901f(80 GHz)\u6d4b\u8bd5\u7684 Socket \u8bbe\u8ba1\"<\/strong>
\nDon Thompson
\nR&D Altanova<\/p>\n

Jose Moreira
\nAdvantest<\/p>\n

\"\"<\/a><\/p>\n

<\/div>\n

\"PDF-Icon<\/a> Presentation Download<\/a><\/p>\n

\"Comparison of Different Methods in Determining Current Carrying Capacity of Semiconductor Test Contacts\"<\/div>\n

\"\u534a\u5bfc\u4f53\u6d4b\u8bd5\u89e6\u5934\u7535\u6d41\u627f\u8f7d\u80fd\u529b\u6d4b\u5b9a\u65b9\u6cd5\u7684\u6bd4\u8f83\"<\/strong>
\nValts Treibergs
\nXcerra Corporation<\/p>\n

Mitchell Nelson
\nXcerra Corporation<\/p>\n

\"\"<\/a><\/p>\n

<\/div>\n

\"PDF-Icon<\/a> Presentation Download<\/a>\t\t\t\t\t<\/p>\n

\"The Economics of Semiconductor Test \u2013 Challenges and Opportunities for 2016\"<\/div>\n

\"\u534a\u5bfc\u4f53\u6d4b\u8bd5\u7684\u7ecf\u6d4e\u5b66-2016\u5e74\u7684\u6311\u6218\u548c\u673a\u9047\"<\/strong>
\nJohn West
\nVLSI Research Europe<\/p>\n

\"\"<\/a><\/p>\n

<\/div>\n

\"PDF-Icon<\/a> Presentation Download<\/a><\/p>\n

 <\/br>
\nReturn to the 2015 BiTS Shanghai Workshop Archive index page<\/a><\/p>\n","protected":false},"excerpt":{"rendered":"

“PCB Test Fixture and DUT Socket Challenges for 32 Gbps\/GBaud ATE Applications” “\u8d85\u9ad8\u901f\u4fe1\u53f7(32Gbps\/Gbaud)\u7684\u6d4b\u8bd5: \u7535\u8def\u677f\u4e0e\u6d4b\u8bd5\u57fa\u5ea7\u7684\u8bbe\u8ba1\u4e0e\u6311\u6218” Jose Moreira Advantest Christian Borelli STMicroelectronics Fulvio Corneo STMicroelectronics  Presentation Download “Designing Sockets for Ludicrous Speed (80 GHz)” “\u9002\u7528\u4e8e\u98de\u901f(80 GHz)\u6d4b\u8bd5\u7684 Socket \u8bbe\u8ba1” Don Thompson R&D Altanova Jose Moreira Advantest  Presentation Download “Comparison of Different Methods in Determining Current Carrying Capacity of Semiconductor Test Contacts” “\u534a\u5bfc\u4f53\u6d4b\u8bd5\u89e6\u5934\u7535\u6d41\u627f\u8f7d\u80fd\u529b\u6d4b\u5b9a\u65b9\u6cd5\u7684\u6bd4\u8f83” Valts … <\/p>\n

Read More<\/a><\/div>\n","protected":false},"author":548,"featured_media":0,"comment_status":"closed","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"footnotes":""},"categories":[10],"tags":[],"class_list":["post-1410","post","type-post","status-publish","format-standard","hentry","category-bitsshanghai2015","no-post-thumbnail"],"_links":{"self":[{"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/posts\/1410","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/users\/548"}],"replies":[{"embeddable":true,"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/comments?post=1410"}],"version-history":[{"count":18,"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/posts\/1410\/revisions"}],"predecessor-version":[{"id":2688,"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/posts\/1410\/revisions\/2688"}],"wp:attachment":[{"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/media?parent=1410"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/categories?post=1410"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/tags?post=1410"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}