
{"id":1190,"date":"2015-03-18T13:00:21","date_gmt":"2015-03-18T20:00:21","guid":{"rendered":"https:\/\/www.testconx.org\/premium\/?p=1190"},"modified":"2023-05-15T09:59:38","modified_gmt":"2023-05-15T16:59:38","slug":"awards-closing-remarks-2","status":"publish","type":"post","link":"https:\/\/www.testconx.org\/premium\/2015\/awards-closing-remarks-2\/","title":{"rendered":"Awards &#038; Closing Remarks"},"content":{"rendered":"<p>It's been three and a half days packed with learning, exploring, and sharing. Before we pack our bags and take what we've learned back to our jobs, there are a few closing remarks. We will take a moment to reflect and recognize the people, presentations, and posters that have distinguished themselves at BiTS 2015.<\/p>\n<p><a href=\"\/premium\/welcome\/\"><img loading=\"lazy\" decoding=\"async\" class=\"alignleft size-full wp-image-129\" title=\"Click here to subscribe to PREMIUM content\" alt=\"\" src=\"\/premium\/wp-content\/uploads\/premium-video-non-subscriber.png\" width=\"480\" height=\"270\" srcset=\"https:\/\/www.testconx.org\/premium\/wp-content\/uploads\/premium-video-non-subscriber.png 480w, https:\/\/www.testconx.org\/premium\/wp-content\/uploads\/premium-video-non-subscriber-300x168.png 300w\" sizes=\"auto, (max-width: 480px) 100vw, 480px\" \/><\/a><\/p>\n<div style=\"clear: both;\"><\/div>\n<p><a href=\"\/premium\/wp-content\/uploads\/2015\/BiTS2015s8p4Closing-Feldman_6069.pdf\" target=\"_blank\"><img loading=\"lazy\" decoding=\"async\" class=\"size-full wp-image-70\" alt=\"PDF-Icon 150x139\" src=\"\/premium\/wp-content\/uploads\/PDF-Icon-150x139.png\" width=\"75\" height=\"70\" \/><\/a>&nbsp;<a href=\"\/premium\/wp-content\/uploads\/2015\/BiTS2015s8p4Closing-Feldman_6069.pdf\" target=\"_blank\" \/>Presentation Download<\/a><\/p>\n<h1>Awards<\/h1>\n<h2>Best Poster<\/h2>\n<p><strong>\"Advanced Kelvin Test Solution for Wafer Level Chip Packages\"<\/strong><br \/>\nJay Kim<br \/>\nLeeno Industrial Inc.<br \/>\n<img decoding=\"async\" src=\"\/premium\/wp-content\/uploads\/bestposter.png\" alt=\"Best Poster\" \/><\/p>\n<div style=\"clear: both;\"><\/div>\n<p><a href=\"\/premium\/wp-content\/uploads\/2015\/BiTS2015poster2Kim_3847.pdf\" target=\"_blank\"><img loading=\"lazy\" decoding=\"async\" class=\"size-full wp-image-70\" alt=\"PDF-Icon 150x139\" src=\"\/premium\/wp-content\/uploads\/PDF-Icon-150x139.png\" width=\"75\" height=\"70\" \/><\/a>&nbsp;<a href=\"\/premium\/wp-content\/uploads\/2015\/BiTS2015poster2Kim_3847.pdf\" target=\"_blank\" \/>Poster Download<\/a><\/p>\n<h2>Best Data<\/h2>\n<p><strong>\"PCB Test Fixture and DUT Socket Challenges for 32 Gbps\/GBaud ATE Applications\"<\/strong><br \/>\nJose Moreira<br \/>\nAdvantest<\/p>\n<p>Christian Borelli, Fulvio Corneo<br \/>\nSTMicroelectronics<br \/>\n<img decoding=\"async\" src=\"\/premium\/wp-content\/uploads\/bestdata.png\" alt=\"\" \/><\/p>\n<p><a href=\"\/premium\/welcome\/\"><img loading=\"lazy\" decoding=\"async\" class=\"alignleft size-full wp-image-129\" title=\"Click here to subscribe to PREMIUM content\" alt=\"\" src=\"\/premium\/wp-content\/uploads\/premium-video-non-subscriber.png\" width=\"480\" height=\"270\" srcset=\"https:\/\/www.testconx.org\/premium\/wp-content\/uploads\/premium-video-non-subscriber.png 480w, https:\/\/www.testconx.org\/premium\/wp-content\/uploads\/premium-video-non-subscriber-300x168.png 300w\" sizes=\"auto, (max-width: 480px) 100vw, 480px\" \/><\/a><\/p>\n<div style=\"clear: both;\"><\/div>\n<p><a href=\"\/premium\/wp-content\/uploads\/2015\/BiTS2015s6p4Moreira_3191.pdf\" target=\"_blank\"><img loading=\"lazy\" decoding=\"async\" class=\"size-full wp-image-70\" alt=\"PDF-Icon 150x139\" src=\"\/premium\/wp-content\/uploads\/PDF-Icon-150x139.png\" width=\"75\" height=\"70\" \/><\/a>&nbsp;<a href=\"\/premium\/wp-content\/uploads\/2015\/BiTS2015s6p4Moreira_3191.pdf\" target=\"_blank\" \/>Presentation Download<\/a><\/p>\n<h2>Most Inspirational Presentation<\/h2>\n<p><strong>\"APEX Glass for Burn-In and Test Sockets\"<\/strong><br \/>\nJeb H. Flemming, Tim Foster<br \/>\n3D Glass Solutions, Inc.<br \/>\n<img decoding=\"async\" src=\"\/premium\/wp-content\/uploads\/inspirational.png\" alt=\"\" \/><\/p>\n<p><a href=\"\/premium\/welcome\/\"><img loading=\"lazy\" decoding=\"async\" class=\"alignleft size-full wp-image-129\" title=\"Click here to subscribe to PREMIUM content\" alt=\"\" src=\"\/premium\/wp-content\/uploads\/premium-video-non-subscriber.png\" width=\"480\" height=\"270\" srcset=\"https:\/\/www.testconx.org\/premium\/wp-content\/uploads\/premium-video-non-subscriber.png 480w, https:\/\/www.testconx.org\/premium\/wp-content\/uploads\/premium-video-non-subscriber-300x168.png 300w\" sizes=\"auto, (max-width: 480px) 100vw, 480px\" \/><\/a><\/p>\n<div style=\"clear: both;\"><\/div>\n<p><a href=\"\/premium\/wp-content\/uploads\/2015\/BiTS2015s4p3Flemming_9839.pdf\" target=\"_blank\"><img loading=\"lazy\" decoding=\"async\" class=\"size-full wp-image-70\" alt=\"PDF-Icon 150x139\" src=\"\/premium\/wp-content\/uploads\/PDF-Icon-150x139.png\" width=\"75\" height=\"70\" \/><\/a>&nbsp;<a href=\"\/premium\/wp-content\/uploads\/2015\/BiTS2015s4p3Flemming_9839.pdf\" target=\"_blank\" \/>Presentation Download<\/a><\/p>\n<h2>Best Presentation - Tutorial<\/h2>\n<p><strong>\"Comparison of Different Methods in Determining Current Carrying Capacity of Semiconductor Test Contacts\"<\/strong><br \/>\nValts Treibergs<br \/>\nXcerra Corporation<br \/>\n<img decoding=\"async\" src=\"\/premium\/wp-content\/uploads\/tutorial.png\" alt=\"\" \/><\/p>\n<p><a href=\"\/premium\/welcome\/\"><img loading=\"lazy\" decoding=\"async\" class=\"alignleft size-full wp-image-129\" title=\"Click here to subscribe to PREMIUM content\" alt=\"\" src=\"\/premium\/wp-content\/uploads\/premium-video-non-subscriber.png\" width=\"480\" height=\"270\" srcset=\"https:\/\/www.testconx.org\/premium\/wp-content\/uploads\/premium-video-non-subscriber.png 480w, https:\/\/www.testconx.org\/premium\/wp-content\/uploads\/premium-video-non-subscriber-300x168.png 300w\" sizes=\"auto, (max-width: 480px) 100vw, 480px\" \/><\/a><\/p>\n<div style=\"clear: both;\"><\/div>\n<p><a href=\"\/premium\/wp-content\/uploads\/2015\/BiTS2015s2p2Treibergs_9275.pdf\" target=\"_blank\"><img loading=\"lazy\" decoding=\"async\" class=\"size-full wp-image-70\" alt=\"PDF-Icon 150x139\" src=\"\/premium\/wp-content\/uploads\/PDF-Icon-150x139.png\" width=\"75\" height=\"70\" \/><\/a>&nbsp;<a href=\"\/premium\/wp-content\/uploads\/2015\/BiTS2015s2p2Treibergs_9275.pdf\" target=\"_blank\" \/>Presentation Download<\/a><\/p>\n<h2>Attendee Choice<\/h2>\n<p><strong>\"BURst Pressure (BURP) Stress Test for MEMS Pressure Sensors\"<\/strong><br \/>\nPeter Jones & Ray Sessego<br \/>\nFreescale Semiconductor<br \/>\n<img decoding=\"async\" src=\"\/premium\/wp-content\/uploads\/attendeechoice.png\" alt=\"\" \/><\/p>\n<p><a href=\"\/premium\/welcome\/\"><img loading=\"lazy\" decoding=\"async\" class=\"alignleft size-full wp-image-129\" title=\"Click here to subscribe to PREMIUM content\" alt=\"\" src=\"\/premium\/wp-content\/uploads\/premium-video-non-subscriber.png\" width=\"480\" height=\"270\" srcset=\"https:\/\/www.testconx.org\/premium\/wp-content\/uploads\/premium-video-non-subscriber.png 480w, https:\/\/www.testconx.org\/premium\/wp-content\/uploads\/premium-video-non-subscriber-300x168.png 300w\" sizes=\"auto, (max-width: 480px) 100vw, 480px\" \/><\/a><\/p>\n<div style=\"clear: both;\"><\/div>\n<p><a href=\"\/premium\/wp-content\/uploads\/2015\/BiTS2015s1p4Jones_4991.pdf\" target=\"_blank\"><img loading=\"lazy\" decoding=\"async\" class=\"size-full wp-image-70\" alt=\"PDF-Icon 150x139\" src=\"\/premium\/wp-content\/uploads\/PDF-Icon-150x139.png\" width=\"75\" height=\"70\" \/><\/a>&nbsp;<a href=\"\/premium\/wp-content\/uploads\/2015\/BiTS2015s1p4Jones_4991.pdf\" target=\"_blank\" \/>Presentation Download<\/a><\/p>\n<h2>Best Paper\/Presentation<\/h2>\n<p><strong>\"Designing Sockets for Ludicrous Speed (80 GHz)\"<\/strong><br \/>\nDon Thompson<br \/>\nR&D Altanova<\/p>\n<p>Jose Moreira<br \/>\nAdvantest<br \/>\n<img decoding=\"async\" src=\"\/premium\/wp-content\/uploads\/bestpaper.png\" alt=\"\" \/><\/p>\n<p><a href=\"\/premium\/welcome\/\"><img loading=\"lazy\" decoding=\"async\" class=\"alignleft size-full wp-image-129\" title=\"Click here to subscribe to PREMIUM content\" alt=\"\" src=\"\/premium\/wp-content\/uploads\/premium-video-non-subscriber.png\" width=\"480\" height=\"270\" srcset=\"https:\/\/www.testconx.org\/premium\/wp-content\/uploads\/premium-video-non-subscriber.png 480w, https:\/\/www.testconx.org\/premium\/wp-content\/uploads\/premium-video-non-subscriber-300x168.png 300w\" sizes=\"auto, (max-width: 480px) 100vw, 480px\" \/><\/a><\/p>\n<div style=\"clear: both;\"><\/div>\n<p><a href=\"\/premium\/wp-content\/uploads\/2015\/BiTS2015s6p3Thompson_6954.pdf\" target=\"_blank\"><img loading=\"lazy\" decoding=\"async\" class=\"size-full wp-image-70\" alt=\"PDF-Icon 150x139\" src=\"\/premium\/wp-content\/uploads\/PDF-Icon-150x139.png\" width=\"75\" height=\"70\" \/><\/a>&nbsp;<a href=\"\/premium\/wp-content\/uploads\/2015\/BiTS2015s6p3Thompson_6954.pdf\" target=\"_blank\" \/>Presentation Download<\/a><br \/>\n<br \/>&nbsp;<\/br><br \/>\nReturn to the 2015 BiTS Workshop Archive <a title=\"Return to 2015 Index\" href=\"\/premium\/bits-workshop-2015-event-archive\">index page<\/a><\/p>\n","protected":false},"excerpt":{"rendered":"<p>It&#8217;s been three and a half days packed with learning, exploring, and sharing. Before we pack our bags and take what we&#8217;ve learned back to our jobs, there are a few closing remarks. We will take a moment to reflect and recognize the people, presentations, and posters that have distinguished themselves at BiTS 2015. &nbsp;Presentation Download Awards Best Poster &#8220;Advanced &#8230; <\/p>\n<div><a href=\"https:\/\/www.testconx.org\/premium\/2015\/awards-closing-remarks-2\/\" class=\"more-link\">Read More<\/a><\/div>\n","protected":false},"author":548,"featured_media":0,"comment_status":"closed","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"footnotes":""},"categories":[9],"tags":[],"class_list":["post-1190","post","type-post","status-publish","format-standard","hentry","category-bits2015","no-post-thumbnail"],"_links":{"self":[{"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/posts\/1190","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/users\/548"}],"replies":[{"embeddable":true,"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/comments?post=1190"}],"version-history":[{"count":11,"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/posts\/1190\/revisions"}],"predecessor-version":[{"id":1258,"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/posts\/1190\/revisions\/1258"}],"wp:attachment":[{"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/media?parent=1190"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/categories?post=1190"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/tags?post=1190"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}