In this second test cell integration session, we hear specialized test solutions that target very specific requirements. Jason Mroczkowski, Xcerra, describes a complete test cell for high volume manufacturing (HVM) that meets the challenges of RF testing for next generation automotive radar devices. Bob Bartlett, Advantest, describes a universal device interface (UDI) framework that can be used by test engineers to quickly integrate any kind of PCB evaluation board or device interface for characterization, bring-up, and HVM. Roger Sinsheimer, Teradyne, explains how to extend existing ATE test instruments in new ways for specialized test requirements for niche markets solutions.<\/p>\n
\"A Test-Cell-Solution for 81GHz Automotive Radar ICs\"<\/strong> \"Universal Device Interface DUT Solutions for ATE Test\"<\/strong> \"Where No Tester Has Gone Before\"<\/strong>
\nJason Mroczkowski, Peter Cockburn, John Shelley
\nXcerra Corporation<\/p>\n![\"\"](\"\/premium\/wp-content\/uploads\/premium-video-non-subscriber.png\" "\\"Click")
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<\/a> Presentation Download<\/a> <\/p>\n
\nBob Bartlett
\nAdvantest Corporation<\/p>\n<\/a><\/p>\n<\/div>\n<\/a> Presentation Download<\/a> <\/p>\n
\nRoger Sinsheimer
\nTeradyne Inc.<\/p>\n<\/a><\/p>\n<\/div>\n<\/a> Presentation Download<\/a> <\/p>\n