
{"id":4762,"date":"2020-06-28T16:01:42","date_gmt":"2020-06-28T23:01:42","guid":{"rendered":"https:\/\/www.testconx.org\/premium\/?page_id=4762"},"modified":"2023-05-15T10:00:53","modified_gmt":"2023-05-15T17:00:53","slug":"road-ahead","status":"publish","type":"page","link":"https:\/\/www.testconx.org\/premium\/road-ahead\/","title":{"rendered":"Semiconductor Test Consumables \u2013 <br>The Road Ahead"},"content":{"rendered":"<div id=\"cs-content\" class=\"cs-content\"><\/div>\n","protected":false},"excerpt":{"rendered":"<p>June 24, 2020 A special interactive webinar sponsored by SWTest, VLSI Research , and TestConX looking at the current and future semiconductor test consumables market. Jerry Broz will lead with an overview of the current and forecasted semiconductor device market including key industry statistics. His overview will include a review of the top wafer probe card suppliers. In a holistic &#8230; <\/p>\n<div><a href=\"https:\/\/www.testconx.org\/premium\/road-ahead\/\" class=\"more-link\">Read More<\/a><\/div>\n","protected":false},"author":548,"featured_media":0,"parent":0,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"","meta":{"footnotes":""},"class_list":["post-4762","page","type-page","status-publish","hentry","no-post-thumbnail"],"_links":{"self":[{"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/pages\/4762","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/users\/548"}],"replies":[{"embeddable":true,"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/comments?post=4762"}],"version-history":[{"count":45,"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/pages\/4762\/revisions"}],"predecessor-version":[{"id":4829,"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/pages\/4762\/revisions\/4829"}],"wp:attachment":[{"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/media?parent=4762"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}