{"id":1787,"date":"2016-09-13T15:23:02","date_gmt":"2016-09-13T22:23:02","guid":{"rendered":"https:\/\/www.testconx.org\/premium\/?page_id=1787"},"modified":"2023-05-15T10:00:27","modified_gmt":"2023-05-15T17:00:27","slug":"bits-china-2016","status":"publish","type":"page","link":"https:\/\/www.testconx.org\/premium\/bits-china-2016\/","title":{"rendered":"BiTS China 2016"},"content":{"rendered":"\n<h1><span style=\"color: #339966;\">Welcome!<\/span><\/h1>\n<h2>To access the archive contents (presentation slides, videos, multimedia, etc.) sign in using your LinkedIn account by clicking the LinkedIn button to the right. Full Conference Attendees and <a title=\"Details about subscriptions\" href=\"\/premium\/welcome\/\">Subscribers<\/a> have access to all content now. FREE guests, once signed in, have access to the presentations after July 1, 2017.<\/h2>\n<p><span style=\"color: #339966;\">------ This message is only displayed when you are not signed in. ------<\/span>\n\n<h4>Session 1 - September 13, 2016<\/h4>\n<ul>\n<li><a title=\"Opening Remarks\" href=\"\/premium\/2016\/china-keynote-and-opening\/#s0p1\">Opening Remarks<\/a><\/li>\n<li><a title=\"Keynote - Evolutions in Packaging Technologies for IoT \u2013 Assembly and Testing\" href=\"\/premium\/2016\/china-bits-2016-keynote-and-opening\/#s0p2\">Keynote - Evolutions in Packaging Technologies for IoT \u2013 Assembly and Testing<\/a><\/li>\n<li><a title=\"Implementation Challenges of an ATE Test Cell for At-Speed Production Test of 32 Gbps Applications\" href=\"\/premium\/2016\/china-bits-2016-session-1\/#s1p1\">Implementation Challenges of an ATE Test Cell for At-Speed Production Test of 32 Gbps Applications<\/a><\/li>\n<li><a title=\"Addressing Challenges in High Temperature Burn-In\" href=\"\/premium\/2016\/china-bits-2016-session-1\/#s1p2\">Addressing Challenges in High Temperature Burn-In<\/a><\/li>\n<li><a title=\"Derating Transient Voltage Suppressor Diodes for Burn-In Applications\" href=\"\/premium\/2016\/china-bits-2016-session-1\/#s1p3\">Derating Transient Voltage Suppressor Diodes for Burn-In Applications<\/a><\/li>\n<li><a title=\"An Ignorable Testing Technology for High Speed\/Frequency Device Testing\" href=\"\/premium\/2016\/china-bits-2016-session-1\/#s1p4\">An Ignorable Testing Technology for High Speed\/Frequency Device Testing<\/a><\/li>\n<\/ul>\n<h4>Session 2<\/h4>\n<ul>\n<li><a title=\"Study of Probe Pin Internal Resistance\" href=\"\/premium\/2016\/china-bits-2016-session-2\/#s2p1 \">Study of Probe Pin Internal Resistance<\/a><\/li>\n<li><a title=\"Monte Carlo Analysis for PoP Alignment\" href=\"\/premium\/2016\/china-bits-2016-session-2\/#s2p2 \">Monte Carlo Analysis for PoP Alignment<\/a><\/li>\n<li><a title=\"Conductive Elastomer vs Spring Probe: Performance & Application\" href=\"\/premium\/2016\/china-bits-2016-session-2\/#s2p3\">Conductive Elastomer vs Spring Probe: Performance & Application<\/a><\/li>\n<li><a title=\"Do Socket and Kits Design Matter for Die Cracking?\" href=\"\/premium\/2016\/china-bits-2016-session-2\/#s2p4\">Do Socket and Kits Design Matter for Die Cracking?<\/a><\/li>\n<\/ul>\n","protected":false},"excerpt":{"rendered":"<p>Session 1 &#8211; September 13, 2016 Opening Remarks Keynote &#8211; Evolutions in Packaging Technologies for IoT \u2013 Assembly and Testing Implementation Challenges of an ATE Test Cell for At-Speed Production Test of 32 Gbps Applications Addressing Challenges in High Temperature Burn-In Derating Transient Voltage Suppressor Diodes for Burn-In Applications An Ignorable Testing Technology for High Speed\/Frequency Device Testing Session 2 &#8230; <\/p>\n<div><a href=\"https:\/\/www.testconx.org\/premium\/bits-china-2016\/\" class=\"more-link\">Read More<\/a><\/div>\n","protected":false},"author":548,"featured_media":0,"parent":0,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"","meta":{"footnotes":""},"class_list":["post-1787","page","type-page","status-publish","hentry","no-post-thumbnail"],"_links":{"self":[{"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/pages\/1787","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/users\/548"}],"replies":[{"embeddable":true,"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/comments?post=1787"}],"version-history":[{"count":10,"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/pages\/1787\/revisions"}],"predecessor-version":[{"id":2735,"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/pages\/1787\/revisions\/2735"}],"wp:attachment":[{"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/media?parent=1787"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}