{"id":1345,"date":"2015-11-13T17:37:11","date_gmt":"2015-11-14T01:37:11","guid":{"rendered":"https:\/\/www.testconx.org\/premium\/?page_id=1345"},"modified":"2023-05-15T10:00:42","modified_gmt":"2023-05-15T17:00:42","slug":"bits-shanghai-2015-event-page","status":"publish","type":"page","link":"https:\/\/www.testconx.org\/premium\/bits-shanghai-2015-event-page\/","title":{"rendered":"BiTS Shanghai Workshop 2015 Event Archive"},"content":{"rendered":"\n<h4><span style=\"color: #339966;\">Welcome!<\/span><\/h4>\n<h2>To access the archive contents (presentation slides, videos, multimedia, etc.) sign in using your LinkedIn account by clicking the LinkedIn button to the right. Full Conference Attendees and <a title=\"Details about subscriptions\" href=\"\/premium\/welcome\/\">Subscribers<\/a> have access to all content now. FREE guests, once signed in, have access to the presentations after July 1, 2015.<\/h2>\n<p><span style=\"color: #339966;\">------ This message is only displayed when you are not signed in. ------<\/span>\n\n<h4>Session 1 - Wednesday, October 21, 2015<\/h4>\n<ul>\n<li><a title=\"Opening Remarks\" href=\"\/premium\/2015\/keynote-and-opening-remarks\/#s0p1\">Opening Remarks<\/a><\/li>\n<li><a title=\"Keynote - China\u2019s Impact on the Semiconductor Industry\" href=\"\/premium\/2015\/keynote-and-opening-remarks\/#s0p2\">Keynote - China\u2019s Impact on the Semiconductor Industry<\/a><\/li>\n<li><a title=\"PCB Test Fixture and DUT Socket Challenges for 32 Gbps\/Gbaud ATE Applications\" href=\"\/premium\/2015\/shanghai-session-1\/#s1p1\">PCB Test Fixture and DUT Socket Challenges for 32 Gbps\/Gbaud ATE Applications<\/a><\/li>\n<li><a title=\"Designing Sockets for Ludicrous Speed\u000b(80 GHz)\" href=\"\/premium\/2015\/shanghai-session-1\/#s1p2\">Designing Sockets for Ludicrous Speed\u000b(80 GHz)<\/a><\/li>\n<li><a title=\"Comparison of  Different Methods in Determining Current Carrying Capacity of Semiconductor Test Contacts\" href=\"\/premium\/2015\/shanghai-session-1\/#s1p3\">Comparison of  Different Methods in Determining Current Carrying Capacity of Semiconductor Test Contacts<\/a><\/li>\n<li><a title=\"The Economics of Semiconductor Test\u000b Challenges and Opportunities for 2016\" href=\"\/premium\/2015\/shanghai-session-1\/#s1p4\">The Economics of Semiconductor Test\u000b Challenges and Opportunities for 2016<\/a><\/li>\n<\/ul>\n<h4>Session 2<\/h4>\n<ul>\n<li><a title=\"WLP Probing Technology Opportunity and Challenge\" href=\"\/premium\/2015\/shanghai-session-2\/#s2p1 \">WLP Probing Technology Opportunity and Challenge<\/a><\/li>\n<li><a title=\"Pushing the Envelope in DFM (Design for Manufacturing) for 0.2mm Pitch WLCSP Socket\" href=\"\/premium\/2015\/shanghai-session-2\/#s2p2 \">Pushing the Envelope in DFM (Design for Manufacturing) for 0.2mm Pitch WLCSP Socket<\/a><\/li>\n<li><a title=\"Signal Integrity & Impacts by Connector Structures\" href=\"\/premium\/2015\/shanghai-session-2\/#s2p3\">Signal Integrity & Impacts by Connector Structures<\/a><\/li>\n<li><a title=\"LPDDR4 Signal & Power Performance Optimization By Hardware\" href=\"\/premium\/2015\/shanghai-session-2\/#s2p4\">LPDDR4 Signal & Power Performance Optimization By Hardware<\/a><\/li>\n<\/ul>\n","protected":false},"excerpt":{"rendered":"<p>Session 1 &#8211; Wednesday, October 21, 2015 Opening Remarks Keynote &#8211; China\u2019s Impact on the Semiconductor Industry PCB Test Fixture and DUT Socket Challenges for 32 Gbps\/Gbaud ATE Applications Designing Sockets for Ludicrous Speed\u000b(80 GHz) Comparison of Different Methods in Determining Current Carrying Capacity of Semiconductor Test Contacts The Economics of Semiconductor Test\u000b Challenges and Opportunities for 2016 Session 2 &#8230; <\/p>\n<div><a href=\"https:\/\/www.testconx.org\/premium\/bits-shanghai-2015-event-page\/\" class=\"more-link\">Read More<\/a><\/div>\n","protected":false},"author":548,"featured_media":0,"parent":0,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"","meta":{"footnotes":""},"class_list":["post-1345","page","type-page","status-publish","hentry","no-post-thumbnail"],"_links":{"self":[{"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/pages\/1345","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/users\/548"}],"replies":[{"embeddable":true,"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/comments?post=1345"}],"version-history":[{"count":20,"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/pages\/1345\/revisions"}],"predecessor-version":[{"id":2753,"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/pages\/1345\/revisions\/2753"}],"wp:attachment":[{"href":"https:\/\/www.testconx.org\/premium\/wp-json\/wp\/v2\/media?parent=1345"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}