"WLP Probing Technology Opportunity and Challenge"
"WLP探测技术的机会与挑战"
Clark Liu
PowerTech Technology Inc.
"Pushing the Envelope in DFM (Design for Manufacturing) for 0.2mm Pitch WLCSP Socket"
"研发和改进WLCSP Socket, 0.2mm 微间距晶圆测试插座的设计与制造."
Colin Koh
Test Tooling Solutions Group
"Signal Integrity & Impacts by Connector Structures"
"芯片测试探针/座的信号完整性 及其影响"
Jiachun (Frank) Zhou
Smiths Connectors
Dexian Liu
Smiths Connectors
Professor Sun Ling
Jiangsu Key Lab of ASIC Design, Nantong University
"LPDDR4 Signal & Power Performance Optimization By Hardware"
"通过测试硬件的优化来提升LPDDR4信号和电源的性能"
Yuanjun Shi
Twinsolution Technology
Xiao.Yao
HiSilicon Technologies Co
Return to the 2015 BiTS Shanghai Workshop Archive index page