BiTS is the preeminent event for whatâ€™s Now & Next in the test of
packaged integrated circuits (ICs). The technical program and exhibition
is dedicated to providing a forum for the latest information on a broad
range of test topics including final, wafer sort, and burn-in. You will
have many opportunities to meet, network, and explore ideas with other
test professionals who are focused on test consumables, test cell
integration, and test operations.