| 3M |
| Aehr Test Systems |
| Ardent Concepts, Inc. |
| Aries Electronics, Inc. |
| Azimuth Electronics,
Inc. |
| Birk Manufacturing, Inc. |
| Boedeker Plastics, Inc. |
| Brush Wellman, Inc. |
| Chip Scale Review |
| Custom Interconnects |
| Digital Dimensions, Inc.
/ Solidworks |
| Dynamic Test Solutions,
Inc. |
| E. Jordan Brookes Co.,
Inc. |
| EDA Industries |
| Electroworld |
| Enplas Tesco, Inc. |
| Ensinger, Inc. |
| E-tec Interconnect, Ltd. |
| Everett Charles
Technologies |
| Exatron |
| Gryphics, Inc. |
| Hyperion Catalysis
International, Inc. |
| INCAL Technology, Inc. |
| Integrated Test
Corporation |
| Ironwood Electronics |
| Johnstech International
Corporation |
| Kulicke & Soffa |
| Marcel Electronics
International |
| Micro Control Company |
| Micronics Japan Co.,
Ltd. |
| Motion Dynamics Corp. |
| NHK Spring Co., Ltd. |
| Nikon Instruments, Inc. |
| Paricon® Technologies
Corporation |
| Phoenix Test Arrays, LLC |
| Piper Plastics, Inc. |
| Plastronics Socket
Company |
| PPI-Time Zero Inc. |
| Protos Electronics |
| Quadrant Engineering
Plastic Products |
| Qualmax, Inc. / Leeno |
| RD Chemical Company |
| Rika Denshi America,
Inc. |
| RJI Technical Sales |
| RS Tech, Inc. |
| Synergetix |
| Texas Instruments |
| UMD Advanced Test
Technologies |
| Unitechno USA, Inc. |
| Victrex USA, Inc. |
| Yamaichi Electronics
USA, Inc. |
| Yokowo America
Corporation |
|
EXPO 2006